SIST EN IEC 62007-2:2025
(Main)Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods (IEC 62007-2:2025)
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods (IEC 62007-2:2025)
IEC 62007-2:2025 specifies measuring methods for characterizing semiconductor optoelectronic devices that are used in the field of fibre optic digital communication systems and subsystems. This third edition cancels and replaces the second edition published in 2009. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) Modification of the definition of “optical fibre pigtail” in 3.1.3;
b) Correction of an error in Formula (1) for relative intensity noise;
c) Correction of an error in Formula (5);
d) Correction of errors in the title of Figure 11 and the text of 4.9 (replaced "LD" with "LED");
e) Clarification of how to calculate the 1 dB compression in 4.9;
f) Corrections of the circuit diagrams in Figure 2, Figure 5, Figure 11, Figure 17, Figure 18, Figure 19, Figure 20, and Figure 21;
g) Clarification of the measurement setup in 5.10 (Figure 28).
Optoelektronische Halbleiterbauelemente für Anwendungen in Lichtwellenleitersystemen - Teil 2: Messverfahren (IEC 62007-2:2025)
Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes fibroniques - Partie 2: Méthodes de mesure (IEC 62007-2:2025)
IEC 62007-2:2025 décrit les méthodes de mesure permettant de caractériser les dispositifs optoélectroniques à semiconducteurs utilisés dans le domaine des systèmes et sous-systèmes de télécommunications numériques fibroniques. Cette troisième édition annule et remplace la deuxième édition parue en 2009. Cette édition constitue une révision technique.
Cette édition inclut les modifications techniques majeures suivantes par rapport à l’édition précédente:
a) modification de la définition de “fibre amorce” en 3.1.3;
b) correction d’une erreur dans la Formule (1) pour le bruit d’intensité relative;
c) correction d’une erreur dans la Formule (5);
d) correction d’erreurs dans le titre de la Figure 11 et du texte en 4.9 (remplacement de "DL" par "LED");
e) clarification sur le mode de calcul de la compression à 1 dB en 4.9;
f) corrections des schémas du circuit de la Figure 2, la Figure 5, la Figure 11, la Figure 17, la Figure 18, la Figure 19, la Figure 20 et la Figure 21;
g) clarification du montage de mesure en 5.10 (Figure 28).
Polprevodniške optoelektronske naprave za uporabo v sistemih z optičnimi vlakni - 2. del: Merilne metode (IEC 62007-2:2025)
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
01-november-2025
Nadomešča:
SIST EN 62007-2:2009
Polprevodniške optoelektronske naprave za uporabo v sistemih z optičnimi vlakni
- 2. del: Merilne metode (IEC 62007-2:2025)
Semiconductor optoelectronic devices for fibre optic system applications - Part 2:
Measuring methods (IEC 62007-2:2025)
Optoelektronische Halbleiterbauelemente für Anwendungen in Lichtwellenleitersystemen
- Teil 2: Messverfahren (IEC 62007-2:2025)
Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes
fibroniques - Partie 2: Méthodes de mesure (IEC 62007-2:2025)
Ta slovenski standard je istoveten z: EN IEC 62007-2:2025
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
33.180.01 Sistemi z optičnimi vlakni na Fibre optic systems in
splošno general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD EN IEC 62007-2
NORME EUROPÉENNE
EUROPÄISCHE NORM September 2025
ICS 31.080.01; 31.260; 33.180.01 Supersedes EN 62007-2:2009
English Version
Semiconductor optoelectronic devices for fibre optic system
applications - Part 2: Measuring methods
(IEC 62007-2:2025)
Dispositifs optoélectroniques à semiconducteurs pour Optoelektronische Halbleiterbauelemente für Anwendungen
application dans les systèmes fibroniques - Partie 2: in Lichtwellenleitersystemen - Teil 2: Messverfahren
Méthodes de mesure (IEC 62007-2:2025)
(IEC 62007-2:2025)
This European Standard was approved by CENELEC on 2025-08-15. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
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Türkiye and the United Kingdom.
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Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2025 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 62007-2:2025 E
European foreword
The text of document 86C/1975/FDIS, future edition 3 of IEC 62007-2, prepared by SC 86C "Fibre
optic systems, sensing and active devices" of IEC/TC 86 "Fibre optics" was submitted to the IEC-
CENELEC parallel vote and approved by CENELEC as EN IEC 62007-2:2025.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2026-09-30
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2028-09-30
document have to be withdrawn
This document supersedes EN 62007-2:2009 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 62007-2:2025 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standard indicated:
IEC 60793 (series) NOTE Approved as EN IEC 60793 (series)
IEC 60794 (series) NOTE Approved as EN IEC 60794 (series)
IEC 61300 (series) NOTE Approved as EN 61300 (series)
IEC 61315 NOTE Approved as EN IEC 61315
IEC 61753 (series) NOTE Approved as EN 61753 (series)
IEC 61754 (series) NOTE Approved as EN 61754 (series)
IEC 61755 (series) NOTE Approved as EN IEC 61755 (series)
ISO 1101 NOTE Approved as EN ISO 1101
IEC 62007-2 ®
Edition 3.0 2025-07
INTERNATIONAL
STANDARD
Semiconductor optoelectronic devices for fibre optic system applications –
Part 2: Measuring methods
ICS 31.080.01; 31.260; 33.180.01 ISBN 978-2-8327-0572-8
IEC 62007-2:2025-07(en)
IEC 62007-2:2025 © IEC 2025
CONTENTS
FOREWORD. 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms, definitions, and abbreviated terms . 6
3.1 Terms and definitions . 6
3.2 Abbreviated terms . 7
4 Measuring methods for photoemitters . 7
4.1 Outline of the measuring methods . 7
4.2 Radiant power and forward current of LEDs and LDs with or without optical
fibre pigtails . 8
4.3 Small signal cut-off frequency of LEDs and LDs with or without optical fibre
pigtails . 9
4.4 Threshold current of LDs with or without optical fibre pigtails . 10
4.5 Relative intensity noise of LEDs and LDs with or without optical fibre pigtails . 11
4.6 S parameter of LEDs, LDs, and LD modules with or without optical fibre
pigtails . 12
4.7 Tracking error for LD modules with optical fibre pigtails, with or without
cooler . 14
4.8 Spectral linewidth of LDs with or without optical fibre pigtails . 17
4.9 Modulation current at 1 dB efficacy compression of LEDs . 19
4.10 Differential efficiency of an LD module or an LD with or without optical fibre
pigtail. 21
4.11 Differential (forward) resistance of an LD with or without optical fibre pigtail . 23
5 Measuring methods for receivers . 24
5.1 Outline of the measuring methods . 24
5.2 Noise of a PIN photodiode . 25
5.3 Excess noise factor of an APD with or without optical fibre pigtails . 27
5.4 Small-signal cut-off frequency of a photodiode with or without optical fibre
pigtails . 29
5.5 Multiplication factor of an APD with or without an optical fibre pigtail . 30
5.6 Responsivity of a PIN-TIA module . 31
5.7 Frequency response flatness of a PIN-TIA module . 33
5.8 Output noise power (spectral) density of a PIN-TIA module . 34
5.9 Low frequency output noise power (spectral) density and corner frequency of
a PIN-TIA module . 36
5.10 Minimum detectable power of PIN-TIA module . 38
Bibliography . 40
Figure 1 – Equipment setup for measuring radiant power and forward current of LEDs
or LDs . 8
Figure 2 – Circuit diagram for measuring f of LEDs or LDs . 9
c
Figure 3 – Circuit diagram for measuring threshold current of LDs . 10
Figure 4 – Graph to determine threshold current of LDs . 11
Figure 5 – Circuit diagram for measuring RIN of LEDs or LDs . 11
Figure 6 – Circuit diagram for measuring the S parameter of LEDs, LDs, or LD
modules . 13
IEC 62007-2:2025 © IEC 2025
Figure 7 – Circuit diagrams for LDs with cathode or anode connected to package . 15
Figure 8 – Output radiant power versus time . 16
Figure 9 – Output radiant power versus case temperature . 17
Figure 10 – Equipment setup for measuring the spectral linewidth of LDs . 18
Figure 11 – Circuit diagram for measuring 1 dB efficacy compression of LEDs . 20
Figure 12 – Plot of 20 × log(V ) versus 20 × log(I ) . 21
2 1
Figure 13 – Circuit diagram for measuring differential efficiency of LDs . 22
Figure 14 – Current waveform for differential efficiency measurement . 22
Figure 15 – Circuit diagram for measuring differential resistance of LDs . 23
Figure 16 – Current waveform for differential resistance . 24
Figure 17 – Circuit diagram for measuring noise of a PIN photoreceiver . 25
Figure 18 – Circuit diagram for measuring noise with synchronous detection . 26
Figure 19 – Circuit diagram for measuring excess noise of an APD . 27
Figure 20 – Circuit diagram for measuring f of a photodiode . 29
c
Figure 21 – Circuit diagram for measuring multiplication factor of an APD . 30
Figure 22 – Graph showing measurement of I and I . 31
R1 R2
Figure 23 – Circuit diagram for measuring responsivity of a PIN-TIA module . 32
Figure 24 – Circuit diagram for measuring frequency response flatness of a PIN-TIA
module . 33
Figure 25 – Circuit diagram for measuring output noise power (spectral) density of a
PIN-TIA module under matched output conditions . 35
Figure 26 – Circuit diagram for measuring output noise power (spectral) density of a
non-irradiated PIN-TIA module in the low frequency region . 36
Figure 27 – Graph of V versus frequency . 38
m
Figure 28 – Circuit diagram for measuring minimum detectable power of a PIN-TIA
module . 39
IEC 62007-2:2025 © IEC 2025
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Semiconductor optoelectronic devices
for fibre optic system applications -
Part 2: Measuring methods
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between t
...
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