ISO/FDIS 4653
(Main)Ferronickel — Determination of carbon, sulfur, silicon, phosphorus, nickel, cobalt, chromium and copper contents — Spark emission spectrometric method
General Information
- Abstract
This document specifies a spark atomic emission spectrometry method for the determination of carbon, sulfur, silicon, phosphorus, nickel, cobalt, chromium, copper contents in ferronickel. This method is applicable to the concentration ranges (mass fraction) in ferronickel: carbon 0.02 to 2.5, sulfur 0.002 to 0.28, silicon 0.10 to 4, phosphorus 0.005 to 0.040, nickel 14.0 to 42.0, cobalt 0.20 to 2.0, chromium 0.10 to 2.0, copper to 0.25.
- Status
- Not Published
- Technical Committee
- ISO/TC 155 - Nickel and nickel alloys
- Drafting Committee
- ISO/TC 155 - Nickel and nickel alloys
- Current Stage
- 5000 - FDIS registered for formal approval
- Start Date
- 09-Jul-2026
- Completion Date
- 09-Jun-2026
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ISO/FDIS 4653 - Ferronickel — Determination of carbon, sulfur, silicon, phosphorus, nickel, cobalt, chromium and copper contents — Spark emission spectrometric method
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Overview
ISO/FDIS 4653:2026 defines a spark atomic emission spectrometric method for the determination of carbon, sulfur, silicon, phosphorus, nickel, cobalt, chromium, and copper content in ferronickel. This international standard, developed by ISO Technical Committee 155 (Nickel and nickel alloys), specifies procedures for sample preparation, calibration, and analysis to ensure accurate and consistent chemical composition results. The method is applicable to a wide range of concentration levels in ferronickel, addressing the needs of industries manufacturing or utilizing ferronickel alloys.
Key Topics
- Elemental Determination: The standard covers analysis of carbon, sulfur, silicon, phosphorus, nickel, cobalt, chromium, and copper.
- Spark Emission Spectrometry: The analytical method uses spark optical emission spectrometry (S-OES) to measure characteristic emission lines of each element.
- Sample Requirements: Procedures for preparing ferronickel samples, including surface preparation to avoid contamination and ensure representative analysis.
- Calibration and Precision: Guidelines for calibration using certified reference materials (CRMs), regression analysis, and the establishment of repeatability and reproducibility limits.
- Quality Control: Procedures for instrument drift correction, usage of drift control samples, recalibration, type recalibration, and interlaboratory comparisons to maintain accuracy.
- Reporting: Requirements for complete and standardized test reports, including sample identification, reference to the standard, and disclosure of deviations or unusual features.
Applications
ISO/FDIS 4653 is essential for laboratories and industries engaged in the production, quality control, and certification of ferronickel used in various sectors, such as:
- Metallurgical Manufacturing: Ensures precise control of alloy composition in steelmaking and specialty metal production.
- Quality Assurance: Supports quality control in foundries and metalworking plants by providing repeatable and reproducible methods for elemental analysis.
- Material Certification: Used by testing laboratories for certification and compliance to customer, regulatory, and contractual specifications.
- Research and Development: Assists R&D departments in developing new ferronickel alloys or improving existing products by enabling accurate composition analysis.
- Supply Chain Verification: Facilitates verification of raw materials and finished products throughout the supply chain, minimizing risks related to material discrepancies.
Related Standards
Relevant standards that complement or support ISO/FDIS 4653 in the analysis of ferronickel and related materials include:
- ISO 8049 – Ferronickel shot - Sampling for analysis: Specifies procedures for obtaining representative samples from ferronickel shot.
- ISO 8050 – Ferronickel ingots or pieces - Sampling for analysis: Addresses sampling techniques for larger or irregular ferronickel forms.
- ISO 5725 (Parts 1-4) – Accuracy (trueness and precision) of measurement methods and results: Foundational methods for assessing repeatability and reproducibility in laboratory measurements.
- ISO 7870-2 – Control charts - Shewhart control charts: Provides statistical process control methodology relevant to monitoring instrument performance.
By following ISO/FDIS 4653, laboratories and ferronickel producers can enhance the accuracy and reliability of their chemical analyses, reduce variability in results, and ensure global consistency in ferronickel quality. Implementing the standard supports regulatory compliance, improves customer trust, and lays the foundation for robust quality management systems in the metal and alloy industry.
Keywords: ISO 4653, spark emission spectrometry, ferronickel analysis, elemental composition, quality control, calibration, laboratory standards, nickel alloys, chemical analysis, metallurgical testing.
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ISO/FDIS 4653 - Ferronickel — Determination of carbon, sulfur, silicon, phosphorus, nickel, cobalt, chromium and copper contents — Spark emission spectrometric method
REDLINE ISO/FDIS 4653 - Ferronickel — Determination of carbon, sulfur, silicon, phosphorus, nickel, cobalt, chromium and copper contents — Spark emission spectrometric method
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Frequently Asked Questions
ISO/FDIS 4653 is a draft published by the International Organization for Standardization (ISO). Its full title is "Ferronickel — Determination of carbon, sulfur, silicon, phosphorus, nickel, cobalt, chromium and copper contents — Spark emission spectrometric method". This standard covers: This document specifies a spark atomic emission spectrometry method for the determination of carbon, sulfur, silicon, phosphorus, nickel, cobalt, chromium, copper contents in ferronickel. This method is applicable to the concentration ranges (mass fraction) in ferronickel: carbon 0.02 to 2.5, sulfur 0.002 to 0.28, silicon 0.10 to 4, phosphorus 0.005 to 0.040, nickel 14.0 to 42.0, cobalt 0.20 to 2.0, chromium 0.10 to 2.0, copper to 0.25.
This document specifies a spark atomic emission spectrometry method for the determination of carbon, sulfur, silicon, phosphorus, nickel, cobalt, chromium, copper contents in ferronickel. This method is applicable to the concentration ranges (mass fraction) in ferronickel: carbon 0.02 to 2.5, sulfur 0.002 to 0.28, silicon 0.10 to 4, phosphorus 0.005 to 0.040, nickel 14.0 to 42.0, cobalt 0.20 to 2.0, chromium 0.10 to 2.0, copper to 0.25.
ISO/FDIS 4653 is classified under the following ICS (International Classification for Standards) categories: 77.100 - Ferroalloys; 77.120.40 - Nickel, chromium and their alloys. The ICS classification helps identify the subject area and facilitates finding related standards.
ISO/FDIS 4653 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
FINAL DRAFT
International
Standard
ISO/TC 155
Ferronickel — Determination of
Secretariat: AFNOR
carbon, sulfur, silicon, phosphorus,
Voting begins on:
nickel, cobalt, chromium and
2026-10-02
copper contents — Spark emission
Voting terminates on:
spectrometric method
2026-11-27
RECIPIENTS OF THIS DRAFT ARE INVITED TO SUBMIT,
WITH THEIR COMMENTS, NOTIFICATION OF ANY
RELEVANT PATENT RIGHTS OF WHICH THEY ARE AWARE
AND TO PROVIDE SUPPOR TING DOCUMENTATION.
IN ADDITION TO THEIR EVALUATION AS
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO
LOGICAL, COMMERCIAL AND USER PURPOSES, DRAFT
INTERNATIONAL STANDARDS MAY ON OCCASION HAVE
TO BE CONSIDERED IN THE LIGHT OF THEIR POTENTIAL
TO BECOME STAN DARDS TO WHICH REFERENCE MAY BE
MADE IN NATIONAL REGULATIONS.
Reference number
FINAL DRAFT
International
Standard
ISO/TC 155
Ferronickel — Determination of
Secretariat: AFNOR
carbon, sulfur, silicon, phosphorus,
Voting begins on:
nickel, cobalt, chromium and
copper contents — Spark emission
Voting terminates on:
spectrometric method
RECIPIENTS OF THIS DRAFT ARE INVITED TO SUBMIT,
WITH THEIR COMMENTS, NOTIFICATION OF ANY
RELEVANT PATENT RIGHTS OF WHICH THEY ARE AWARE
AND TO PROVIDE SUPPOR TING DOCUMENTATION.
© ISO 2026
IN ADDITION TO THEIR EVALUATION AS
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO
LOGICAL, COMMERCIAL AND USER PURPOSES, DRAFT
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
INTERNATIONAL STANDARDS MAY ON OCCASION HAVE
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
TO BE CONSIDERED IN THE LIGHT OF THEIR POTENTIAL
or ISO’s member body in the country of the requester.
TO BECOME STAN DARDS TO WHICH REFERENCE MAY BE
MADE IN NATIONAL REGULATIONS.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland Reference number
ii
Contents Page
Foreword .iv
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Principle . 2
5 Apparatus . 3
6 Sampling . 3
7 Procedure . 3
7.1 Surface preparation .3
7.2 Calibration procedures .4
7.2.1 General .4
7.2.2 Calibration . . .4
7.2.3 Recalibration.5
7.2.4 Type recalibration .5
7.3 Analysis .5
7.3.1 Preparation of analytical programs.5
7.3.2 Analytical method .5
7.3.3 Number of sparks on test samples .5
7.3.4 Status check of the apparatus .6
8 Determination and expression of analysis results . 6
8.1 General .6
8.2 Acceptance of final results from duplicate measurements in the laboratory .6
8.3 Interlaboratory precision and agreement assessment .6
8.3.1 General .6
8.3.2 Calculation of the mean value in two laboratories .6
8.3.3 Calculation of precision standard deviation .6
8.3.4 Critical difference for agreement .7
8.4 Determination of trueness .7
9 Interlaboratory test data of precision and trueness . 7
9.1 General .7
9.2 Interlaboratory test . .8
9.3 Precision data .8
9.4 Trueness data .10
10 Test report .12
Annex A (informative) Analytical spectral lines .13
Annex B (informative) Some theoretical principles in calibration .15
Annex C (normative) Procedure for obtaining the final results .16
Annex D (informative) Compositions of the samples used for the validation test . 17
Annex E (informative) Graphical representation of the precision data .18
Bibliography .31
iii
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out through
ISO technical committees. Each member body interested in a subject for which a technical committee
has been established has the right to be represented on that committee. International organizations,
governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely
with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of ISO document should be noted. This document was drafted in accordance with the editorial rules of the
ISO/IEC Directives, Part 2 (see www.iso.org/directives).
ISO draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed patent
rights in respect thereof. As of the date of publication of this document, ISO had not received notice of (a)
patent(s) which may be required to implement this document. However, implementers are cautioned that
this may not represent the latest information, which may be obtained from the patent database available at
www.iso.org/patents. ISO shall not be held responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO’s adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 155, Nickel and nickel alloys.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.
iv
FINAL DRAFT International Standard ISO/FDIS 4653:2026(en)
Ferronickel — Determination of carbon, sulfur, silicon,
phosphorus, nickel, cobalt, chromium and copper contents —
Spark emission spectrometric method
1 Scope
This document specifies a method for the determination of carbon, sulfur, silicon, phosphorus, nickel, cobalt,
chromium and copper contents in ferronickels by spark optical emission spectrometry (S-OES).
This document is applicable to the following content ranges (in % mass fraction):
— carbon: 0,030 to 2,5
— sulfur: 0,018 to 0,27
— silicon: 0,13 to 4,2
— phosphorus: 0,007 to 0,04
— nickel: 14,3 to 25,0
— cobalt 0,13 to 2,2
— chromium: 0,08 to 2,3
— copper: 0,019 to 0,26
This document does not apply to arbitration analysis.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content constitutes
requirements of this document. For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments) applies.
ISO 8049, Ferronickel shot — Sampling for analysis
ISO 8050, Ferronickel ingots or pieces — Sampling for analysis
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at https:// www .electropedia .org/
3.1
reference material
RM
material, sufficiently homogeneous and stable with respect to one or more specified properties, which has
been established to be fit for its intended use in a measurement process
[SOURCE: ISO 33400:2026, 3.1.1, modified — "in a measurement process" added. Notes to entry deleted.]
3.2
certified reference material
CRM
reference material (3.1) characterized by a metrologically valid procedure for one or more specified
properties, accompanied by an RM certificate that provides the value of the specified property, its associated
uncertainty and a statement of metrological traceability
3.3
test sample
representative quantity of material for testing purposes
3.4
drift control samples
series of homogeneous materials that contain all the elements which have been calibrated and that cover
the low, mid and high points of the calibration range for each element, used to detect variations over time in
these points
Note 1 to entry: Drift control samples can also be used for statistical process control (SPC) of the instrument.
3.5
recalibration sample
sample at either a low and high point of the calibration ranges used to recalibrate the spectrometer
Note 1 to entry: Recalibration samples are measured during the calibration procedure and the intensities obtained
are stored in the computer according to the manufacturer's instructions.
Note 2 to entry: No chemical analyses are necessary, but the homogeneity of the recalibration samples should be
carefully evaluated.
3.6
type recalibration sample
reference sample or internally developed standard sample, with the same matrix and comparable
composition as the test sample (3.3)
3.7
quality control sample
sample with known composition which is analysed in the same way as the test sample (3.3) to check the
trueness of the analytical results
4 Principle
The method described in this document involves applying an electrical discharge between the sample, which
serves as one electrode, and an inert counter-electrode to generate a spark, and then measuring the intensity
of the radiation emitted by this spark, whose wavelength corresponds to the characteristic radiation of each
element of interest.
The content of each element is determined by relating the measured intensities of test samples to calibration
curves prepared from reference materials.
5 Apparatus
5.1 Optical emission spectrometer.
Spectrometer with spark source capable of measuring the intensities of the optical radiation emitted at
specific wavelengths by the elements present in the material.
The wavelengths generally used are given in Annex A.
5.2 Apparatus for sample surface preparation.
The most common surface preparation techniques for ferronickel are milling and grinding or turning,
provided that the composition of the surface shall not be influenced.
The lathe, milling machine or any other machines used for surface preparation shall be able to produce a
surface that conforms to the requirements of 7.1.
WARNING — The appropriate safety recommendations for the use of mechanical apparatus shall
be observed. These operations shall be carried out only by properly trained personnel wearing
appropriate personal protective equipment.
6 Sampling
Sampling shall be carried out in accordance with ISO 8049 or ISO 8050, as appropriate.
The sample shall be sufficiently homogeneous with regard to spark impact. The measuring surface should
be free of imperfections.
7 Procedure
7.1 Surface preparation
7.1.1 The surface of the sample shall be prepared so that it is sufficiently flat and smooth to tighten the
sample chamber and shall be reasonably free of contaminants, pores, cracks, inclusions and shrinkage
cavities that can otherwise affect the analytical results.
In order to avoid variation of results due to the influence of surface finish, the same method of preparation
shall be used for all samples.
To avoid cross-contamination between different sample materials, all relevant components of the machine
shall be thoroughly cleaned before use or separate tools shall be used.
Once the surface has been prepared, avoid any contamination (e.g. fingerprints).
Measurements shall be carried out soon after surface preparation. Samples should be stored, until the time
of later measurement, in a desiccator.
7.1.2 The milling, grinding or turning shall be carried out at a suitable speed to avoid undue heating of the
sample surface, which can otherwise lead to bias in analysis.
Any lubricants (e.g. propanol) used shall be selected to ensure that they do not affect the analytical result.
7.2 Calibration procedures
7.2.1 General
7.2.1.1 Calibration process
The calibration process is subdivided into calibration and drift compensation by recalibration.
7.2.1.2 Range of calibration
The range of calibration for an element shall extend well below the minimum content reported in the list of
alloys composition and above the maximum content reported in the same list, taking into account that the
lowest limit should be at least equal to the quantification limit.
7.2.1.3 Number of sparks on calibration samples
The number of sparks carried out on each certified reference material (CRM) or reference material (RM)
for calibration shall not be less than four. The spark areas shall be distributed over the prepared surface.
Centre and border of the sample shall be avoided. All measurements shall be examined; if any measurement
is obviously defective, further sparks shall be carried out to obtain the minimum four acceptable
measurements. The average of the four acceptable measurements is used for calibration.
The influence of temperature is very important for direct measurement methods. The sample should be
cooled to ambient temperature between each spark.
7.2.2 Calibration
The calibration of the spectrometer is carried out by using a series of CRMs or RMs which have the same
or at least similar matrix and metallurgical structure as the samples to be analysed, in order to calculate
the calibration functions from which the analysis of test samples can be obtained. The content range of the
CRMs used shall cover that of all the samples to be analysed within each specific analytical program. For
each element in each CRM or RM, the mean intensity is correlated to the corresponding certified content,
and a regression is calculated.
Calibration CRMs or RMs should span the composition ranges and types of materials expected. Extrapolation
is prohibited. The number of CRMs and RMs used for each curve should be twice the number of coefficients
to be determined by regression, including the curve parameters and any correction coefficients. Minimally,
there should be at least one more data point than the number of coefficients or constants in the formula. The
proportion of CRMs in the analytical curve shall be at least 60 %.
For each element in every RM, a regression curve is generated by relating the measured intensity to the
certified content. The calibration functions are usually stored in a computer connected to the spectrometer.
These calibration functions are first or second order polynomials. Verification of the quality of the
adjustment is done by means of the regression residuals graph, as explained in Clause B.1, and, if possible,
by a normal probability plot of the regression residuals. Abnormal behaviour of the points indicates the
necessity of either excluding or including new CRM or RM, or both (e.g. the choice of other calibration
functions and adjustment in the content range). When the calibration range of any particular element is
large, two calibration curves covering different parts of that range may be used.
The calibration shall be in accordance with the spectrometer manufacturer's instruction manual.
The trueness of the analytical procedure is checked by measuring a set of CRMs or, if not available, a set of
RMs not used in the calibration. These RMs shall cover at least the low, mid and high points of the calibration
range for each element. The difference between the analysis value of each element and the certified value
should not exceed ±2σ (σ is the uncertainty or standard deviation of the certified value of each element
of the standard sample). If the measurement results do not match the certified values, the cause shall be
identified, and the calibration curve shall be redrawn or optimized.
Some theoretical principles related to calibration are provided in Annex B for reference.
7.2.3 Recalibration
Drift of the spectrometer readings shall be corrected using a recalibration procedure as described in the
manufacturer's instruction manual. Recalibrations can be done either for all analytical channels (global
recalibration) or only for individual analytical channels (selective recalibration).
Recalibration can either be done periodically or due to a deviation from SPC limits (see 7.3.4). When a
periodical recalibration procedure is used, the period depends on the stability of the spectrometer and shall
be established by a stability check of the spectrometer. The stability check shall be repeated at appropriate
intervals.
NOTE The same set of check samples can be used both for drift control and for SPC of the spectrometer.
After recalibration, a set of RMs shall be measured for confirmation. The RMs used shall cover at least the
low, mid and high points of the elements being analysed. The difference between the analysis value of each
element and the certified value should not exceed ±2σ (σ is the uncertainty or standard deviation of the
certified value of each element of the standard sample). If the measurement result of the RMs does not match
the certified values, the cause shall be identified, and recalibration shall be carried out again.
7.2.4 Type recalibration
Type recalibration offers a further possibility of correcting instrument drift and, in addition, for matrix
influences. In this process, one or two type recalibration samples are analysed alongside the test sample.
Subsequently, through linear correction, the contents of the test sample are correlated with the certified
values of the type recalibration sample(s). This operation should be conducted in accordance with the
instrument software's type recalibration procedure.
NOTE This practice cannot be employed if the calibration function is a second order one, unless the element to be
calibrated has a content very close to that of the type recalibration sample.
7.3 Analysis
7.3.1 Preparation of analytical programs
Analytical programs can be prepared either by measuring only the intensities of all the elements concerned,
or by taking into account the ratios between the measured intensity for each element and the intensity
corresponding to the “matrix element” taken as internal standard.
In principle, intensity measurements are used for trace analysis purposes (e.g. phosphorus), while rationed
measurements are taken for the determination of other levels of content.
During the preparation of an analytical program, the possible optical interferences or the inter-elements
effects, or both, shall also be carefully investigated, and suitable corrections shall be made. Possible
interferences or effects are given in Annex A.
The preparation of analytical programs shall be in accordance with the spectrometer manufacturer's
instruction manual.
7.3.2 Analytical method
The method used shall be in accordance with the spectrometer manufacturer's instruction manual.
7.3.3 Number of sparks on test samples
The spark areas shall be distributed over the prepared surface, and whenever possible, approximately
midway between the centre and the border, thereby avoiding the centre of the sample. The number of sparks
carried out on a test sample shall be at least two. All the measurements shall be examined. If the two sparks
are inconsistent, a third or fourth measurement is required and shall follow the procedure given in Annex C.
7.3.4 Status check of the apparatus
Any change from the original status of the spectrometer (e.g. drifts) shall be checked at regular intervals
by analysing drift control samples or quality control samples in accordance with the spectrometer
manufacturer's instruction manual. It is common practice to document the status of the spectrometer
using control charts. The difference between the results of these checks and their reference values are
plotted regularly on a control chart. If the points of the control charts present different behaviours from
the expected pattern (see ISO 7870-2), then further actions (e.g. recalibration, type recalibration, further
checks, new calibration) shall be taken.
The period between checking the spectrometer status depends on its stability and the analytical assignment
and can be derived from the control charts.
8 Determination and expression of analysis results
8.1 General
This clause specifies the procedures for calculating, expressing and verifying the acceptability of analytical
results obtained by this method.
Results are expressed in percentages (mass fractions).
8.2 Acceptance of final results from duplicate measurements in the laboratory
Having computed the duplicate results, compare them with the repeatability limit (r) from Table 2 or Table 3,
using the procedure given in Annex C, and obtain the final laboratory result.
8.3 Interlaboratory precision and agreement assessment
8.3.1 General
This subclause specifies the procedure for assessing the agreement between final results reported by two
laboratories, assuming both have followed the method described in this document.
8.3.2 Calculation of the mean value in two laboratories
Calculate the mean of the two final results by using Formula (1):
(1)
12,
where
μ is the final result reported by laboratory 1;
μ is the final result reported by laboratory 2;
µ is the mean of final results.
1,2
8.3.3 Calculation of precision standard deviation
Using µ as the content value, obtain the reproducibility limit (R) and repeatability limit (r)
1,2
from Table 2 or Table 3, as applicable.
Then calculate the following standard deviations:
— Reproducibility standard deviation by using Formula (2):
R/,283 (2)
R
©
...
ISO/TC 155/WG 15
Secretariat: AFNOR
Date: 2026-05-1909-17
Ferronickel — Determination of carbon, sulfur, silicon, phosphorus,
nickel, cobalt, chromium, and copper contents — Spark emission
spectrometric method
FDIS stage
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication
may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying,
or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO
at the address below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: + 41 22 749 01 11
E-mail: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii
Contents
Foreword . iv
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 2
4 Principle . 3
5 Apparatus . 3
6 Sampling . 3
7 Procedure . 3
7.1 Calibration procedures . Error! Bookmark not defined.
7.2 Surface preparation . 3
7.3 Analysis . 6
8 Determination and expression of analysis results . 6
8.1 General. 6
8.2 Acceptance of final results from duplicate measurements in the laboratory . 6
8.3 Interlaboratory precision and agreement assessment . 7
8.4 Determination of trueness . 7
9 Interlaboratory test data of precision and trueness . 8
9.1 General. 8
9.2 Interlaboratory test . 8
9.3 Precision data . 8
9.4 Trueness data . 11
10 Test report . 14
Annex A (informative) Analytical spectral lines . 15
Annex B (informative) Some theoretical principles in calibration . 17
Annex C (normative) Procedure for obtaining the final results . 18
Annex D (informative) Compositions of the samples used for the validation test . 19
Annex E (informative) Graphical representation of the precision data. 20
Bibliography . 33
iii
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out through
ISO technical committees. Each member body interested in a subject for which a technical committee has been
established has the right to be represented on that committee. International organizations, governmental and
non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the
International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types of
ISO documentsdocument should be noted. This document was drafted in accordance with the editorial rules
of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
ISO draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed patent rights
in respect thereof. As of the date of publication of this document, ISO had not received notice of (a) patent(s)
which may be required to implement this document. However, implementers are cautioned that this may not
represent the latest information, which may be obtained from the patent database available at
www.iso.org/patents. ISO shall not be held responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO’s adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 155, Nickel and nickel alloys.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.
iv
Ferronickel — Determination of carbon, sulfur, silicon, phosphorus,
nickel, cobalt, chromium, and copper contents — Spark emission
spectrometric method
1 Scope
This document specifies a method for the determination of carbon, sulfur, silicon, phosphorus, nickel, cobalt,
chromium, and copper contents in ferronickels by spark optical emission spectrometry (S-OES). This method
cannot be used for arbitration analysis.
The methodThis document is applicable to the following content ranges (in % mass fraction) given in
Table 1.):
Table 1 — Content ranges
Content range
Element
% (mass fraction)
Carbon 0,030 to 2,5
Sulfur 0,018 to 0,27
Silicon 0,13 to 4,2
Phosphorus 0,007 to 0,04
a
Nickel 14,3 to 25,0
Cobalt 0,13 to 2,2
Chromium 0,08 to 2,3
Copper 0,019 to 0,26
NOTE Table note.
a
The values from 25,0 % to 48,3 % are indicative.
— carbon: 0,030 to 2,5
— sulfur: 0,018 to 0,27
— silicon: 0,13 to 4,2
— phosphorus: 0,007 to 0,04
— nickel: 14,3 to 25,0
— cobalt 0,13 to 2,2
— chromium: 0,08 to 2,3
— copper: 0,019 to 0,26
This method document cannot be used for does not apply to arbitration analysis.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content constitutes
requirements of this document. For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments) applies.
ISO 8049, Ferronickel shot — Sampling for analysis
ISO 8050, Ferronickel ingots or pieces — Sampling for analysis
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https://www.iso.org/obp
— IEC Electropedia: available at https://www.electropedia.org/
3.1
reference material
RM
material, sufficiently homogeneous and stable with respect to one or more specified properties, which has
been established to befitbe fit for its intended use in a measurement process
[SOURCE: ISO GUIDE 30:2015, 2. ISO 33400:2026, 3.1.1, modified — the"in a measurement process" added.
Notes to entry have been deleted.]
3.2
certified reference material
CRM
reference material (RM)(3.1) characterized by a metrologically valid procedure for one or more specified
properties, accompanied by an RM certificate that provides the value of the specified property, its associated
uncertainty, and a statement of metrological traceability
[SOURCE: ISO GUIDE 30:2015, 2.1.2, modified — the Notes to entry have been deleted.]
3.3
test sample
representative quantity of material for testing purposes
3.4
drift control samples
series of homogeneous materials that contain all the elements which have been calibrated and that cover the
low, mid and high points of the calibration range for each element, used to detect variations over time in these
points
Note 1 to entry: Drift control samples can also be used for statistical process control (SPC) of the instrument.
3.5
recalibration samplessample
samplessample at botheither a low and high pointspoint of the calibration ranges used to recalibrate the
spectrometer
Note 1 to entry: These Recalibration samples are measured during the calibration procedure, and the intensities obtained
are stored in the computer according to the manufacturer's instructions.
Note 2 to entry: No chemical analyses are necessary, but the homogeneity of thesethe recalibration samples should be
carefully evaluated.
3.6
type recalibration samplessample
reference samplessample or internally developed standard samplessample, with the same matrix and
comparable composition as the test sample (3.3samples)
3.7
quality control sample
sample with known composition which is analysed in the same way as the test sample (3.3) to check the
trueness of the analytical results
4 Principle
The method described in this document involves applying an electrical discharge between the sample, which
serves as one electrode, and an inert counter-electrode to generate a spark, and then measuring the intensity
of the radiation emitted by this spark, whose wavelength corresponds to the characteristic radiation of each
element of interest.
The content of each element is determined by relating the measured intensities of test samples to calibration
curves prepared from reference materials.
5 Apparatus
5.1 Optical emission spectrometer.
Spectrometer with spark source capable of measuring the intensities of the optical radiation emitted at
specific wavelengths by the elements present in the material.
The wavelengths generally used are given in Annex A.
5.2 Apparatus for sample surface preparation.
The most common surface preparation techniques for ferronickel are milling and grinding or turning,
provided that the composition of the surface shall not be influenced.
The lathe, milling machine or any other machines used for surface preparation shall be able to produce a
surface that conforms to the requirements of 7.1.
WARNING — The appropriate safety recommendations for the use of mechanical apparatus shall be
observed. These operations shall be carried out only by properly trained personnel wearing
appropriate personal protective equipment.
6 Sampling
Sampling shall be carried out in accordance with ISO 8049 or ISO 8050, as appropriate.
The sample shall be sufficiently homogeneous with regard to spark impact. The measuring surface should be
free of imperfections.
7 Procedure
7.1 Surface preparation
7.1.1 The surface of the sample shall be prepared so that it is sufficiently flat and smooth to tighten the
sample chamber and shall be reasonably free of contaminants, pores, cracks, inclusions, and shrinkage cavities
that maycan otherwise affect the analytical results.
In order to avoid variation of results due to the influence of surface finish, the same method of preparation
shall be used for all samples.
To avoid cross-contamination between different sample materials, all relevant components of the machine
shall be thoroughly cleaned before use or separate tools shall be used.
Once the surface has been prepared, avoid any contamination, (e.g. fingerprints.).
Measurements shall be carried out soon after surface preparation. Samples should be stored, until the time of
later measurement, in a desiccator.
7.1.2 The milling, grinding or turning shall be carried out at a suitable speed to avoid undue heating of the
sample surface, which willcan otherwise possibly lead to bias in analysis.
Any lubricants (e.g. propanol) used shall be selected to ensure that they do not affect the analytical result.
7.2 Calibration procedures
7.2.1 General
7.2.1.1 Calibration process
The calibration process is subdivided into calibration and drift compensation by recalibration.
7.2.1.2 Range of calibration
The range of calibration for an element shall extend well below the minimum content reported in the list of
alloys composition and above the maximum content reported in the same list, taking into account that the
lowest limit should be at least equal to the quantification limit.
7.2.1.3 Number of sparks on calibration samples
The number of sparks carried out on each certified reference material (CRM) or reference material (RM) for
calibration shall not be less than four. The spark areas shall be distributed over the prepared surface. Centre
and border of the sample shall be avoided. All measurements shall be examined; if any measurement is
obviously defective, further sparks shall be carried out to obtain the minimum four acceptable measurements.
The average of the four acceptable measurements is used for calibration.
The influence of temperature is very important for direct measurement methods. The sample should be cooled
to ambient temperature between each spark.
7.2.2 Calibration
The calibration of the spectrometer is carried out by using a series of certified reference materials (CRMs) or
reference materials (RMs) which have the same or at least similar matrix and metallurgical structure as the
samples to be analysed, in order to calculate the calibration functions from which the analysis of test samples
can be obtained. The content range of the certified reference materialsCRMs used shall cover that of all the
samples to be analysed within each specific analytical program. For each element in each CRM or RM, the mean
intensity is correlated to the corresponding certified content, and a regression is calculated.
Calibration CRMs or RMs should span the composition ranges and types of materials expected. Extrapolation
is prohibited. It is recommended that theThe number of CRMs and RMs used for each curve isshould be twice
the number of coefficients to be determined by regression. This includes, including the curve parameters and
any correction coefficients. Minimally, there should be at least one more data point than the number of
coefficients or constants in the equationformula. The proportion of CRMs in the analytical curve shall be at
least 60 %.
For each element in every reference materialRM, a regression curve is generated by relating the measured
intensity to the certified content. The calibration functions are usually stored withinin a computer, connected
st nd
to the spectrometer. These calibration functions are 1 first or 2 second order polynomials. Verification of the
quality of the adjustment is done by means of the regression residuals graph, as explained in Clause B.1, and,
if possible, by a normal probability plot of the regression residuals. Abnormal behaviour of the points indicates
the necessity of either excluding or including new CRM or RM, or both; (e.g. the choice of other calibration
functions and adjustment in the content range, for instance.). When the calibration range of any particular
element is large, two calibration curves covering different parts of that range may be used.
The calibration shall be in accordance with the spectrometer manufacturer's instruction manual.
The trueness of the analytical procedure is checked by measuring a set of certified reference materialsCRMs
or—, if not available—, a set of reference materialsRMs not used in the calibration. These reference
materialsRMs shall cover at least the low, mid, and high points of the calibration range for each element. The
difference between the analysis value of each element and the certified value should not exceed ±2σ (σ is the
uncertainty or standard deviation of the certified value of each element of the standard sample). If the
measurement results do not match the certified values, the cause shall be identified, and the calibration curve
shall be redrawn or optimized.
Some theoretical principles related to calibration are provided in Annex B for reference.
7.2.3 Recalibration
Drift of the spectrometer readings shall be corrected using a recalibration procedure as described in the
manufacturer's instruction manual. Recalibrations can be done either for all analytical channels (global
recalibration),) or only for individual analytical channels (selective recalibration).
Recalibration can either be done periodically or due to a deviation from statistical process control (SPC) limits
(see 7.3.4). When a periodical recalibration procedure is used, the period depends on the stability of the
spectrometer and shall be established by a stability check of the spectrometer. The stability check shall be
repeated at appropriate intervals.
NOTE The same set of check samples can be used both for drift control and for statistical process controlSPC of the
spectrometer.
After recalibration, a set of reference materialsRMs shall be measured for confirmation. The reference
materialsRMs used shall cover at least the low, mid, and high points of the elements being analysed. The
difference between the analysis value of each element and the certified value should not exceed ±2σ (σ is the
uncertainty or standard deviation of the certified value of each element of the standard sample). If the
measurement result of the reference materialsRMs does not match the certified values, the cause shall be
identified, and recalibration shall be carried out again.
7.2.4 Type recalibration
Type recalibration offers a further possibility of correcting instrument drift and, in addition, for matrix
influences. In this process, one or two type recalibration samples are analysed alongside the test sample.
Subsequently, through linear correction, the contents of the test sample are correlated with the certified
values of the type recalibration sample(s). This operation should be conducted in accordance with the
instrument software's type recalibration procedure.
nd
NOTE This practice cannot be employed if the calibration function is a 2 second order one, unless the element to
be calibrated has a content very close to that of the type recalibration sample.
7.3 Analysis
7.3.1 Preparation of analytical programs
Analytical programs can be prepared either by measuring only the intensities of all the elements concerned,
or by taking into account the ratios between the measured intensity for each element and the intensity
corresponding to the "“matrix element"” taken as internal standard.
In principle, intensity measurements are used for trace analysis purposes (e.g. phosphorus), whilstwhile
rationed measurements are taken for the determination of other levels of content.
During the preparation of an analytical program, the possible optical interferences or the inter-elements
effects, or both, shall also be carefully investigated, and suitable corrections shall be made. Possible
interferences or effects are given in Annex A.
The preparation of analytical programs shall be in accordance with the spectrometer manufacturer's
instruction manual.
7.3.2 Analytical method
The method used shall be in accordance with the spectrometer manufacturer's instruction manual.
7.3.3 Number of sparks on test samples
The spark areas shall be distributed over the prepared surface, and whenever possible, approximately midway
between the centre and the border, thereby avoiding the centre of the sample. The number of sparks carried
out on a test sample shall be at least two. All the measurements shall be examined. If the two sparks are
inconsistent, a third or fourth measurement is required and shall follow the procedure given in Annex C.
7.3.4 Status check of the apparatus
Any change from the original status of the spectrometer (e.g. drifts) shall be checked at regular intervals by
analysing drift control samples or quality control samples in accordance with the spectrometer
manufacturer's instruction manual. It is common practice to document the status of the spectrometer using
control charts. The difference between the results of these checks and their reference values are plotted
regularly on a control chart. If the points of the control charts present different behaviours from the expected
pattern (see ISO 7870-2), then further actions (e.g. recalibration, type recalibration, further checks, new
calibration) shall be taken.
The period between checking the spectrometer status depends on its stability and the analytical assignment
and can be derived from the control charts.
8 Determination and expression of analysis results
8.1 General
This clause specifies the procedures for calculating, expressing, and verifying the acceptability of analytical
results obtained by this method.
Results are expressed in percentages (mass fractions).
8.18.2 Acceptance of final results from duplicate measurements in the laboratory
Having computed the duplicate results, compare them with the repeatability limit (r) from Table 32 or
Table 43, using the procedure given in Annex C, and obtain the final laboratory result.
8.28.3 Between-laboratoryInterlaboratory precision and agreement assessment
8.3.1 General
This clausesubclause specifies the procedure for assessing the agreement between final results reported by
two laboratories, assuming both have followed the method described in this document.
8.2.18.3.2 Calculation of the mean value in two laboratories
Calculate the mean of the two final results by using Formula (1):
𝜇𝜇 +𝜇𝜇
1 2
𝜇𝜇 =
1,2
(1)
where
μ is the final result reported by laboratory 1;
μ is the final result reported by laboratory 2;
µ1,2 is the mean of final results.
8.2.28.3.3 Calculation of precision standard deviation
Using µ as the content value, obtain the reproducibility limit (R) and repeatability limit (r)
1,2
from Table 32 or Table 43, as applicable.
Then calculate the following standard deviations:
— Reproducibility standard deviation by using Formula (2):
𝜎𝜎 =𝑅𝑅/2,83 (2)
𝑅𝑅
— Repeatability standard deviation by using Formula (3):
𝜎𝜎 =𝑟𝑟/2,83 (3)
𝑟𝑟
— Between-laboratoryInterlaboratory standard deviation by using Formula (4):
2 2
𝜎𝜎 =�𝜎𝜎 −𝜎𝜎 (4)
𝐿𝐿 𝑟𝑟
𝑅𝑅
8.2.38.3.4 Critical difference for agreement
Calculate the critical difference P by using Formula (5):
2 2
𝑃𝑃 = 2,83�𝜎𝜎 +𝜎𝜎 /2 (5)
𝑟𝑟
𝐿𝐿
The absolute difference between the two laboratory results, |𝜇𝜇 −𝜇𝜇 |, shall not exceed P. If this condition is
1 2
met, the results are considered to be in agreement.
8.38.4 Determination of trueness
This clausesubclause specifies the procedure for assessing the trueness of the analytical method by comparing
the average measurement result from duplicate analyses against the certified value of a reference materialRM.
The trueness is verified by analyzinganalysing a certified reference material (CRM) or a reference material
(RM) and comparing the average of two measurement results to its certified value.
The absolute difference between the average value of the two measurement results and the certified value
¯
|𝑋𝑋−𝜇𝜇 | shall not exceed the critical difference CD (, as per Formula (6)formula 6) or C (, as per
0.,95
Formula (7)formula 7).
NOTE At the 95 % probability level, the critical difference CD0,95 of the absolute value of the difference between the
average value of the two measurement results and the certified value is calculated according to Formula (6)formula (6)::
2 2
CD = �𝑅𝑅 −𝑟𝑟 /2 (6)
0,95
√
where
R is the reproducibility limit, obtained from Table 32 or Table 43;
r is the repeatability limit, obtained from Table 32 or Table 43.
When the uncertainty of the CRM or RM cannot be ignored, the critical difference, C, can be calculated
according to Formula (7)formula (7)::
𝐶𝐶 = 𝐶𝐶𝐷𝐷 +𝑈𝑈 (7)
�
0,95
where U is the uncertainty of the CRM or RM.
9 Interlaboratory test data of precision and trueness
9.1 General
This clause presents the data and statistical evaluation from an interlaboratory validation test, conducted to
establish the precision and trueness of the method specified in this document.
9.19.2 Interlaboratory test
Fourteen laboratories in five countries participated in an interlaboratory validation test, involving three
determinations of eight elements at ten contents (samples). The chemical composition of the samples used in
the interlaboratory test is given in Annex D.
Each laboratory carried out two determinations under repeatability conditions as defined in ISO 5725-1, i.e.
one operator, same apparatus, identical operating conditions, same calibr
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