SIST EN ISO 18563-3:2024

SLOVENSKI STANDARD
01-september-2024
Neporušitvene preiskave - Ugotavljanje značilnosti in preverjanje ultrazvočne
opreme faznih sistemov - 3. del: Kombinirani sistemi (ISO 18563-3:2024)
Non-destructive testing - Characterization and verification of ultrasonic phased array
equipment - Part 3: Complete systems (ISO 18563-3:2024)
Zerstörungsfreie Prüfung - Charakterisierung und Verifizierung der Ultraschall-
Prüfausrüstung mit phasengesteuerten Arrays - Teil 3: Vollständige Prüfsysteme (ISO
18563-3:2024)
Essais non destructifs - Caractérisation et vérification de l’appareillage ultrasonore
multiélément - Partie 3: Système complet (ISO 18563-3:2024)
Ta slovenski standard je istoveten z: EN ISO 18563-3:2024
ICS:
19.100 Neporušitveno preskušanje Non-destructive testing
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EN ISO 18563-3
EUROPEAN STANDARD
NORME EUROPÉENNE
May 2024
EUROPÄISCHE NORM
ICS 19.100 Supersedes EN ISO 18563-3:2015
English Version
Non-destructive testing - Characterization and verification
of ultrasonic phased array equipment - Part 3: Complete
systems (ISO 18563-3:2024)
Essais non destructifs - Caractérisation et vérification Zerstörungsfreie Prüfung - Charakterisierung und
de l'appareillage ultrasonore multiélément - Partie 3: Verifizierung der Ultraschall-Prüfausrüstung mit
Systèmes complets (ISO 18563-3:2024) phasengesteuerten Arrays - Teil 3: Vollständige
Prüfsysteme (ISO 18563-3:2024)
This European Standard was approved by CEN on 20 April 2024.

CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this
European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references
concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN
member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by
translation under the responsibility of a CEN member into its own language and notified to the CEN-CENELEC Management
Centre has the same status as the official versions.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway,
Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Türkiye and
United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION

EUROPÄISCHES KOMITEE FÜR NORMUNG

CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2024 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO 18563-3:2024 E
worldwide for CEN national Members.

Contents Page
European foreword . 3

European foreword
This document (EN ISO 18563-3:2024) has been prepared by Technical Committee ISO/TC 135 "Non-
destructive testing" in collaboration with Technical Committee CEN/TC 138 “Non-destructive testing”
the secretariat of which is held by AFNOR.
This European Standard shall be given the status of a national standard, either by publication of an
identical text or by endorsement, at the latest by November 2024, and conflicting national standards
shall be withdrawn at the latest by November 2024.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN shall not be held responsible for identifying any or all such patent rights.
This document supersedes EN ISO 18563-3:2015.
Any feedback and questions on this document should be directed to the users’ national standards
body/national committee. A complete listing of these bodies can be found on the CEN website.
According to the CEN-CENELEC Internal Regulations, the national standards organizations of the
following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland,
Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of
North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Türkiye and the
United Kingdom.
Endorsement notice
The text of ISO 18563-3:2024 has been approved by CEN as EN ISO 18563-3:2024 without any
modification.
International
Standard
ISO 18563-3
Second edition
Non-destructive testing —
2024-05
Characterization and verification
of ultrasonic phased array
equipment —
Part 3:
Complete systems
Essais non destructifs - Caractérisation et vérification de
l’appareillage ultrasonore multiélément —
Partie 3: Systèmes complets
Reference number
ISO 18563-3:2024(en) © ISO 2024

ISO 18563-3:2024(en)
© ISO 2024
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii
ISO 18563-3:2024(en)
Contents Page
Foreword .iv
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 2
4 Symbols . 2
5 General requirements for conformity . 3
5.1 General .3
5.2 Reference system .3
5.3 Identical system .3
5.4 Periodic checks .3
6 Qualification of test personnel . 4
7 Modes of operation for phased array techniques . 4
8 Equipment required for tests . 6
9 Tests to be performed . 6
9.1 General .6
9.2 External aspects of the equipment .8
9.2.1 General .8
9.2.2 Procedure .8
9.2.3 Acceptance criteria .8
9.2.4 Reporting .8
9.3 Elements and channels .8
9.3.1 General .8
9.3.2 Channel assignment .8
9.3.3 Relative sensitivity of elements, reference amplitude and dead elements .10
9.4 Verification of correct operation . 12
9.4.1 General . 12
9.4.2 Amplification system . 12
9.4.3 Verification of correct operation by using imaging . 15
9.4.4 Verification of correct operation by using beams .18
9.4.5 Skew angle . 22
9.5 Other verifications . 22
9.5.1 Squint angle . 22
9.5.2 Grating lobes (recommended) . 23
10 System record sheet .23
Annex A (informative) Characterization of sound beams .25
Bibliography .32

iii
ISO 18563-3:2024(en)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out through
ISO technical committees. Each member body interested in a subject for which a technical committee
has been established has the right to be represented on that committee. International organizations,
governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely
with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of ISO document should be noted. This document was drafted in accordance with the editorial rules of the
ISO/IEC Directives, Part 2 (see www.iso.org/directives).
ISO draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed patent
rights in respect thereof. As of the date of publication of this document, ISO had not received notice of (a)
patent(s) which may be required to implement this document. However, implementers are cautioned that
this may not represent the latest information, which may be obtained from the patent database available at
www.iso.org/patents. ISO shall not be held responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO's adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 135 Non-destructive testing, Subcommittee
SC 3 Ultrasonic testing, in collaboration with the European Committee for Standardization (CEN) Technical
Committee CEN/TC 138, Non-destructive testing, in accordance with the Agreement on technical cooperation
between ISO and CEN (Vienna Agreement).
This second edition cancels and replaces the first edition (ISO 18563-3:2015), which has been technically
revised.
The main changes are as follows:
— integration of matrix array probes;
— deletion of group 1 and 2 tests;
— addition of a clause on the use of imaging for complete system verification (9.4.3) as a simplification for
a more functional standard (characterisation of beams moved to Annex A);
— addition of signal processing techniques using arrays (e.g. total focusing technique (TFM)) in the scope.
A list of all parts in the ISO 18563 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.

iv
International Standard ISO 18563-3:2024(en)
Non-destructive testing — Characterization and verification
of ultrasonic phased array equipment —
Part 3:
Complete systems
1 Scope
This document addresses ultrasonic test systems implementing array probes, for contact technique (with
or without wedge) or for immersion technique, with centre frequencies in the range of 0,5 MHz to 10 MHz.
This document provides methods and acceptance criteria for determining the compliance of the complete
system (see 3.2). Its purpose is for the verification of the correct operation of the system prior to testing or
verification of the absence of degradation of the system.
The methods are not intended to prove the suitability of the system for particular applications but are intended
to prove the capability of the complete system (used for an application) to operate correctly according to the
settings used. Tests can be performed on individual ultrasonic beams (for phased array technique, see 9.4.4)
or on resulting images (for phased array technique and total focusing technique, see 9.4.3).
The tests can be limited to the functions that are intended to be used for a certain application.
This document does not cover the sensitivity setting of the system for a specific application. Nor does it
apply to the characterization or verification of the mechanical scanning equipment. It is intended that these
items will be covered by the test procedure.
This document does not address the phased array technique using tandem technique.
The characterization of beams, as recommended in case of dead elements or for more in-depth knowledge of
the beams, is presented in Annex A. It is not applicable for signal processing technology using arrays.
NOTE Unless stated otherwise, in this document ‘TFM’ and ‘TFM technique’ refer to the total focusing technique
as defined in ISO 23243, and to related techniques, see for example ISO 23865 and ISO 23234.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content constitutes
requirements of this document. For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments) applies.
ISO 5577, Non-destructive testing — Ultrasonic testing — Vocabulary
ISO 9712, Non-destructive testing — Qualification and certification of NDT personnel
ISO 18563-1, Non-destructive testing — Characterization and verification of ultrasonic phased array equipment
— Part 1: Instruments
ISO 18563-2, Non-destructive testing — Characterization and verification of ultrasonic phased array equipment
— Part 2: Probes
ISO 22232-2, Non-destructive testing — Characterization and verification of ultrasonic test equipment — Part
2: Probes
ISO 23243, Non-destructive testing — Ultrasonic testing with arrays — Vocabulary

ISO 18563-3:2024(en)
3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 5577, ISO 23243 and the
following apply.
ISO and IEC maintain terminology databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at https:// www .electropedia .org/
3.1
combined equipment
connected set including the instrument, the array probe (with wedge if applicable) and connecting cables,
including adapters
[SOURCE: ISO 23243:2020. Modified – array and wedge added]
3.2
complete system
combined equipment including the settings for a given mode of operation
Note 1 to entry: Settings are specific values or ranges of values, e.g. electronic scanning or steering range.
3.3
reference system
complete system, including an instrument according to ISO 18563-1 and an array probe initially according to
ISO 18563-2, on which all of the applicable tests defined in Clause 9 of this document have been performed
successfully
3.4
identical system
complete system in which instrument, array probe, wedge, connecting cables and the settings for a given
mode of operation are identical to those of the reference system
Note 1 to entry: Components are identical if from the same manufacturer and the same model.
3.5
system record sheet
document for reporting the results for a complete system which enables a comparison with the values
obtained from the reference system
4 Symbols
For the purposes of this document, the symbols given in Table 1 apply.
Table 1 — Symbols
Symbol Unit Definitions
(X ; Z ) mm; mm Coordinates of the position of the centre of the reference reflector
C C
(X ; Z ) mm; mm Coordinates of the position of maximum amplitude of an indication
M M
A V or % FSH Amplitude of one elementary signal
el
Contact technique: reduced projected sound path length
a mm
Immersion technique: distance between the orthogonal projection of the axis of the side-
i
drilled hole on the test surface and the centre of the probe front surface
A V or % FSH Maximum value of the amplitudes of all elementary signals
max
A V or % FSH Minimum value of the amplitudes of all elementary signals, excluding the dead elements
min
A V or % FSH Median value of the amplitudes of all elementary signals
ref
ISO 18563-3:2024(en)
TTabablele 1 1 ((ccoonnttiinnueuedd))
Symbol Unit Definitions
D mm Diagonal of the active aperture
Distance between the centre of a side-drilled hole and the point of maximum amplitude of
D mm
CM
the indication of this hole
G dB Reference gain
ref
N mm Near-field length associated with the active aperture
p mm Pitch
X mm Distance between the probe front surface and the probe index point for the studied beam
s
ΔS dB Relative sensitivity of an element
el
Θ ° Angle of refraction
λ mm Wavelength
5 General requirements for conformity
5.1 General
All following tests shall be performed with an instrument that complies with ISO 18563-1 and an array that
initially complied with ISO 18563-2.
The tests can be limited to the functions that are intended to be used for a certain application, e.g. used
channels of the instrument or used part of the array or specific settings for a specified mode of operation.
When all required tests have been successfully conducted, the complete system is considered to conform to
this document.
5.2 Reference system
a) The tests to be performed prior to the first use of a complete system are described in Table 4.
When all required tests have been successfully conducted, this complete system may be used as a
reference system. The results of the measurements made are the base values.
b) A system record sheet of these base values shall be created.
5.3 Identical system
a) When an identical system is created, and/or when using other channels of the instrument and duplicating
the settings, or after a maintenance operation or after the replacement of a system component, the tests
as described in Table 4 shall be performed again.
b) The results of the measurements made on the identical system shall be recorded in the system record
sheet and compared against the base values.
5.4 Periodic checks
a) For a periodic check of correct operation of the system, the tests as described in Table 4 shall be
performed again.
b) The frequency of checking of the complete system shall be specified in the test procedure, e. g. before
starting and at the end of the non-destructive testing or daily, weekly, monthly, depending on the
application.
c) Each periodic check shall be documented on the system record sheet, either by recording the values of
the checks or by stating that the results are within the acceptance criteria.

ISO 18563-3:2024(en)
6 Qualification of test personnel
a) Personnel performing the verifications in accordance with this document shall be qualified to an
appropriate level in ultrasonic testing in accordance with ISO 9712 or equivalent.
b) In addition to general knowledge of ultrasonic testing, the operators shall be familiar with, and have practical
experience in, the use of the ultrasonic phased array technique or the total focusing technique (TFM).
7 Modes of operation for phased array techniques
This clause is not applicable for signal processing techniques using arrays, e.g. TFM.
This clause is applicable for phased array techniques based on beams by using a set of delay laws for multiple
array elements during transmission and/or reception.
Depending on the application, the following options of the phased array technique may be used:
— number of active apertures (one or multiple);
— number of shots or delay laws (one or multiple) per active aperture;
— type of delay law (beam steering, beam focusing or combined setting).
The six most common modes of operation for phased array techniques are defined in Table 2.
Examples of modes of operation for phased array techniques are illustrated in Table 3.
Considering these different modes of operation and their resulting beams, the number of beams or images to
be tested is described in Table 4.
Table 2 — Definition of modes of operation for phased array techniques
Number Number of delay Identical or differ-
Array orienta-
Modes of active laws per active ent set of delay laws Resulting beam(s)
tion
apertures aperture for each aperture
Not applicable
Mode 1 One One Not relevant One beam
(only one aperture)
Not applicable Multiple beams from one active
Mode 2 One Multiple Not relevant
(only one aperture) aperture
Array parallel to One beam from each active ap-
Mode 3 Multiple One Identical
the test surface erture, all beams are identical
Multiple beams from each ac-
Array parallel to
Mode 4 Multiple Multiple Identical tive aperture, beams are identi-
the test surface
cal for all active apertures
Array not parallel
One beam from each active
Identical
to the test surface
Mode 5 Multiple One aperture, beams are different
for each active aperture
Different Not relevant
Array not parallel
Multiple beams from each
Identical
to the test surface
Mode 6 Multiple Multiple active aperture, beams are dif-
ferent for each active aperture
Different Not relevant
ISO 18563-3:2024(en)
Table 3 — Examples of modes of operation for phased array techniques
Modes Examples
Mode 1
a) Beam steering b) Beam focusing on one point
Mode 2
b) Focusing on several points
a) Electronic sectorial scanning
Mode 3
a) Electronic linear scanning with constant delay
b) Electronic linear scanning with focusing
path
Mode 4
a) Electronic sectorial scanning together with b) Focusing on several points together with elec-
electronic linear scanning tronic linear scanning
Mode 5
a) Electronic linear scanning with varying delay b) Electronic linear scanning with focusing or
path combined electronic scanning
The medium between the array and the test object may be a fluid (immersion) or a solid (e.g. wedge).
NOTE 1 For simplicity, only the beam centre lines are indicated. An arrow indicates the beam direction, dots indicate focal
points.
ISO 18563-3:2024(en)
TTabablele 3 3 ((ccoonnttiinnueuedd))
Modes Examples
Mode 6
a) Electronic sectorial scanning together with b) Focusing on several points together with elec-
electronic linear scanning tronic linear scanning
The medium between the array and the test object may be a fluid (immersion) or a solid (e.g. wedge).
NOTE 1 For simplicity, only the beam centre lines are indicated. An arrow indicates the beam direction, dots indicate focal
points.
8 Equipment required for tests
The equipment required for the tests of a complete system includes:
a) suitable reference block(s);
b) measurement devices for the length with an accuracy of ±0,5 mm and for the angle with an accuracy of ±1°.
9 Tests to be performed
9.1 General
a) Before performing the tests, the equipment settings shall be made according to the array and wedge
that are in use for the application.
b) For applications where only a part of the array is used, the tests can be limited to this part. In that case,
the results of the tested part of the array shall be recorded on the system record sheet, including a
description of the tested part of the array.
c) The tests described in Table 4 shall be performed initially (5.2), after every maintenance operation or
after the replacement of a system component (5.3), and periodically (5.4).
Table 4 describes the various tests to be conducted on a complete system based on the different modes of
operation for phased array techniques.
The last column of Table 4 describes the various tests to be conducted on a complete system in case of signal
processing techniques using arrays. For conciseness, it is named TFM mode.
For tests where Table 4 indicates that it is required to verify at least three beams, apertures or presentations,
this means at least the median and both extreme situations shall be verified.
For phased array technique, tests can be performed either on individual ultrasonic beams or on resulting
images, if applicable.
For total focusing technique, tests can only be performed on resulting images, because no individual
ultrasonic beams are available.

ISO 18563-3:2024(en)
Table 4 — Tests to be performed
Mode 2 Mode 2
Items Test and clause Mode 1 Mode 3 Mode 4 Mode 5 Mode 6 TFM mode
Example a Example b
External aspects of
External as-
the equipment Required
pects
9.2
Channel assignment
Required for used channels
9.3.2
Relative sensitivity of
Elements and
elements, reference
channels
amplitude and dead Required for used channels
elements
9.3.3
Amplification system
Required for used channels
9.4.2
L-scan
a
Using imaging Not appli- S-scan pres- L-scan pres- At least one L-scan or S-scan At least three L-scan or
Not applicable or S-scan pres- TFM image
b
9.4.3 cable entation entation presentation S-scan presentations
entation
a
Using beams At least the three following
Correct opera-
Not applicable
b
c 9.4.4 beams: first shot of first aper- At least three apertures , and
tion
At least three At least three
b b
Used beam At least 3 beams ture, last shot of last aperture three beams for each of these
b b
apertures apertures
Skew angle Required if
and median shot of median apertures
9.4.5 applied
aperture
Characterization of
sound beams Optional Not applicable
Annex A
Squint angle
Required
9.5.1
Other verifica-
tions
Grating lobes
Optional
9.5.2
a
Verification of correct operation is either done by using imaging (9.4.3) or by using beams (9.4.4).
b
Verifications shall be done for extreme and median beams or apertures or presentations.
c
For matrix array probes generating beams with skew angles, the verifications shall be performed in the extreme and median deflection planes

ISO 18563-3:2024(en)
9.2 External aspects of the equipment
9.2.1 General
This general visual inspection is intended to verify that there is no degradation of the test equipment.
9.2.2 Procedure
a) Visually inspect the outside of the ultrasonic instrument, the array probes, the cables and the connectors
in order to detect any sign of damage or wear that can affect both the current operation of the system
and its long-term reliability.
b) In particular, inspect the contact surface of the array probe and the wedge.
c) If the probe is made out of various components, verify that they are correctly assembled.
d) Check the wedge dimensions by measuring with a ruler to detect any wear.
9.2.3 Acceptance criteria
All the components of the system shall not show any visible sign of damage or wear that influences the beam
characteristics or imaging.
9.2.4 Reporting
The results of the visual inspection shall be recorded on or appended to the system record sheet.
9.3 Elements and channels
9.3.1 General
These tests are to ensure proper connection of the array probe to the instrument and correct operation of
the array probe once connected.
The tests address:
a) the verification of channel/element assignment for transmission and reception, and the capability of the
instrument to perform the electronic switching operations necessary to activate individual elements
successively;
b) the measurement of the relative sensitivity of the array elements, and the reference amplitude;
c) the identification of any failing component (e.g. dead elements).
9.3.2 Channel assignment
9.3.2.1 Procedure
a) Use a test block with a planar reflecting surface that is not parallel to the array in order to generate
increasing time-of-flight values from element to element, see Table 5 and Figure 1.
b) Activate the elements one by one from the first element to the last element of the array.
c) Compare the individual time-of-flight values of the signals from the reflecting surface from element to
element (e.g. by A-scans, L-scans) (Figure 2).
d) The verification for matrix array probes shall be performed in two phases:
1) first check the individual elements column by column;

ISO 18563-3:2024(en)
2) then, having rotated the matrix array probe by 90°, or a small skew angle when using a wedge,
check row by row.
Table 5 — Test blocks to be used depending on the configuration
Technique Probe configuration Reflecting surface
Without wedge
Block with planar surfaces that are non-parallel (Figure 1 b))
(or wedge removed)
Wedge contact surface if the time-of-flight values differ from element to
Contact tech-
element
nique
With a wedge or
Block with a planar reflecting surface where the impingement angle of
the natural refracted beam is at least a few degrees (Figure 1 a))
Immersion Block with a planar reflective test surface tilted by at least a few de-
-
technique grees with respect to the probe

a) For an array with wedge b) For an array without wedge on a block, e.g.
according to ISO 19675
Key
a impingement angle of the natural refracted beam
b natural refracted beam angle
Figure 1 — Verification of channel assignment
Key
X element position.
Y time of flight.
Figure 2 — Comparing elementary time of flight on imaging, e.g. L-scan

ISO 18563-3:2024(en)
9.3.2.2 Acceptance criteria
a) The longest time of flight shall be associated with the element farthest from the reflecting surface;
b) The shortest time of flight shall be associated with the element closest to the reflecting surface;
c) The time of flight of the received signals shall vary monotonically with element position.
9.3.2.3 Reporting
The settings and results of the test shall be recorded on or appended to the system record sheet.
9.3.3 Relative sensitivity of elements, reference amplitude and dead elements
9.3.3.1 General
The objectives of the following tests are to check the relative sensitivity of the elements, to identify dead
elements and to determine the reference amplitude.
An additional objective of periodic tests is to verify that the possible occurrence of changes in the relative
sensitivity of the elements has no influence on the correct operation of the system.
9.3.3.2 Elementary sensitivity
9.3.3.2.1 Procedure for contact technique
a) Position the array probe on a test block in order to obtain the same time of flight for all of the elements, e.g.:
1) preferably without a wedge (if possible), using a block with parallel surfaces;
2) with a delay line, using the signals from the delay line contact surface;
3) with a wedge, using a test block of the same material with one side inclined at the same angle as the
probe wedge;
b) Activate the elements one by one (transmit and receive with the same element).
c) Display the amplitude of the echo from the reflector for each element.
d) Adjust the gain to have the signal amplitudes approximately at 80 % of FSH and, if necessary, reduce the
gain if the maximum amplitude cannot be read from the display (above 100 % of FSH).
e) Measure the amplitude A of each elementary signal in % of FSH.
el
f) For dual-array probes, perform tests a) to e) for each array separately.
In case of a non-removable wedge, use an adapted block that compensates for the influence of the roof angle.
9.3.3.2.2 Procedure for immersion technique
a) Position the array probe parallel to an immersed test block in order to obtain the same time-of-flight
values for all of the elements.
b) Activate the elements one by one (transmit and receive with the same element).
c) Display the amplitude of the interface echo for each element; perpendicular incidence is obtained if all
signals show an equivalent time of flight within a half-period tolerance.
d) Adjust the gain to have the signal amplitudes approximately at 80 % of FSH and, if necessary, reduce the
gain if the maximum amplitude cannot be read from the display (above 100 % of FSH).
e) Measure the amplitude A of each elementary signal in % of FSH.
el
ISO 18563-3:2024(en)
9.3.3.3 Determination of the reference amplitude
The reference amplitude A is defined as the median of the elementary amplitudes of the elements A .
ref el
a) Calculate A and record it on the system record sheet, together with the applied gain.
ref
b) During the system's service life, use the same settings and the same test block, recalculate A every
ref
time to check the absolute sensitivity of the system.
9.3.3.4 Identification of dead elements
Calculate the relative sensitivity ΔS (in dB) of each element using Formula (1):
el
∆S = 20log(A /A ) (1)
el el ref
An element is considered a dead element, if ΔS < −9 dB.
el
A loss of sensitivity can be caused by the array element, the cable and/or the instrument.
Regardless of the reason, this is named a dead element.
9.3.3.5 Range of sensitivity of elements
A is defined as the maximum A value.
max el
A is defined as the minimum A value excluding dead elements.
min el
Check the range of sensitivity of elements by comparing A and A .
min max
9.3.3.6 Acceptance criteria
The following criteria shall be applied:
a) The reference amplitude A is acceptable if the signal-to-noise ratio is acceptable for the application.
ref
b) If the reference amplitude and the signal-to-noise ratio do not remain acceptable, the beams or images
resulting from the affected active apertures shall be checked. This verification may be performed via
simulation or, for phased array technique, by measurements according to Annex A.
c) The relative sensitivity of elements is acceptable if A – A < 50 % of FSH;
max min
d) The maximum number of dead elements for each active aperture shall not be more than the values given
in Table 6.
Table 6 — Maximum number of dead elements
Type of array probe 0,5 < f ≤ 5 MHz 5 < f ≤ 10 MHz
Linear array
1 out of 16
Matrix array with number ≤ 64 elements
Matrix array with number > 64 elements 10 % 15 %
e) For linear array probes, the dead elements shall not be adjacent.
f) For matrix array probes with up to 64 elements, the dead elements shall not be adjacent.
g) For matrix array probes with more than 64 elements, each dead element shall have maximum one
adjacent dead element.
h) If new dead elements are found during periodical tests, it should be verified that the reference amplitude
of the affected active apertures and the signal-to-noise ratio remain acceptable for the application.

ISO 18563-3:2024(en)
9.3.3.7 Reporting
The settings and results of the tests shall be recorded on or appended to the system record sheet.
9.4 Verification of correct operation
9.4.1 General
a) For phased array techniques, the beams generated in the deflection plane(s) shall be verified either by
using imaging (9.4.3) or by measuring the angle of refraction and the index point (9.4.4).
b) For signal processing techniques using arrays, the term beam is not relevant. Then, only the resulting
TFM image in the deflection plane(s) shall be verified (9.4.3).
c) For imaging with indirect beams or indirect imaging paths, i.e. using reflection(s) at surface(s) of the
test object, the verifications shall be performed using reference block(s) of known thickness.
d) In all cases, prior to the verifications described in 9.4.3 and 9.4.4, the absence of saturation of signals
and the linearity of the amplification system shall be verified (9.4.2).
e) For matrix array probes operating with skew angles, the skew angles shall be verified (9.4.5).
NOTE Presentations in other planes (e.g. type C, top-view, side-view) or imaging using reflection are related to
the test procedure and verifications will be described in it.
9.4.2 Amplification system
9.4.2.1 General
Ultrasonic testing is often based on the evaluation of amplitude values that can be quantitatively altered by
a default in the amplification system due to either:
— a saturation of elementary signals;
— a saturation of summed signals;
— a non-linearity of the amplification system.
Summed signals are obtained either by delaying and summing elementary signals (summed A-scan for
phased array technique) or by synthetic focusing by coherent summation of elementary signal amplitudes
(summed amplitudes for TFM technique). Then the summed signals are displayed as summed A-scan
presentations (for phased array technique) or in an image (for phased array technique or TFM technique).
The summation of multiple elementary signals may be performed analogue or digital, depending on the
design of the instrument (AD-converter, amplifier, processing):
— In all cases, for phased array instruments and TFM instruments, there is a risk for saturation of
summed signals, especially in case of high gain setting, strong ultrasonic signals (e.g. large reflectors) or
summation over a large number of channels;
— In case all or most elementary signals are saturated, the linearity of the summed signals will deviate;
— In case only one or a few elementary signals are saturated (e.g. 1 out of 16), the linearity of the summed
signals may be acceptable because of the limited influence of the saturated signals (e.g. 1/16). The
influence can be so small that there is no measurable effect on the linearity of the summed signals and
the system meets the acceptance criteria.
Typically, the elementary signals are not available to the operator, so the operator cannot perform a
verification of elementary signals. Then the linearity of the amplification system can only be verified
simultaneously with the displayed summed signals.
...