IEC
PT 62607-6-11 - TC 113/PT 62607-6-11
TC 113/PT 62607-6-11
General Information
Status
Active
Work Field
Information technology
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IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
 • defect density nD
 of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
 • Raman spectroscopy
- Technical specification27 pagesEnglish languagesale 15% off
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