SIST EN IEC 63202-1:2019
(Main)Photovoltaic devices - Part 11: Measurement of light-induced degradation of crystalline silicon solar cells
Photovoltaic devices - Part 11: Measurement of light-induced degradation of crystalline silicon solar cells
IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.
Photovoltaik-Zellen - Teil 1: Messung der lichtinduzierten Degradation von kristallinen Silizium-Photovoltaikzellen
Cellules photovoltaïques - Partie 1: Mesure de la dégradation induite par la lumière des cellules photovoltaïques au silicium cristallin
l'IEC 63202-1:2019 décrit les procédures pour la mesure de la dégradation induite par la lumière (LID, light-induced degradation) des cellules photovoltaïques (PV) au silicium cristallin sous éclairement solaire simulé. L'amplitude de la dégradation induite par la lumière dans une cellule photovoltaïque au silicium cristallin est déterminée en comparant la puissance de sortie maximale aux conditions normales d’essai ((STC, standard test conditions) avant et après l'exposition à un éclairement solaire simulé, à une température et un éclairement spécifiés.
L'objet du présent document est de fournir des informations sur la dégradation induite par la lumière des cellules photovoltaïques normalisées, afin d'aider les fabricants de modules photovoltaïques à réduire le plus possible la désadaptation entre les cellules à l'intérieur du même module, augmentant ainsi au maximum le rendement de puissance.
Fotonapetostne naprave - 11. del: Meritve degradacije kristalnih silicijevih sončnih celic, povzročene s svetlobo
Ta evropski standard opisuje postopke za meritve degradacije kristalnih silicijevih fotonapetostnih celic, povzročene s svetlobo (LID), pod simulirano sončno svetlobo. Obseg degradacije, povzročene s svetlobo, v kristalni silicijevi fotonapetostni celici se določi s primerjavo največje izhodne moči pri standardnih preskusnih pogojih (STC) pred izpostavljenostjo simulirani sončni svetlobi pri določeni temperaturi in sevanju ter po njej. Namen tega dokumenta je podati standardizirane informacije o degradaciji fotonapetostnih celic, povzročeni s svetlobo, ki proizvajalcem fotonapetostnih modulov pomagajo zmanjšati neujemanje celic v istem modulu, s čimer se poveča izkoristek energije. Ugotovljeno je bilo, da v primerjavi z meritvami degradacije fotonapetostnih modulov, povzročene s svetlobo, ki je opisana v skupini standardov IEC 61215, na preskus degradacije fotonapetostnih celic, povzročene s svetlobo, pomembno vpliva več dodatnih preskusnih dejavnikov, ki v standardu IEC 61215-2 niso bili upoštevani. Ta dokument določa postopek pogojevanja in merjenja ter nastavitve parametrov, ki so potrebne za dosledne meritve degradacije fotonapetostnih celic, povzročene s svetlobo. Obseg degradacije, povzročene s svetlobo, je eden od pomembnih dejavnikov kakovosti celice. Najpomembnejši dejavnik celic znotraj iste razvrstitve je porazdelitev izhodne moči po degradaciji, povzročeni s svetlobo.
General Information
- Status
- Published
- Publication Date
- 04-Nov-2019
- Technical Committee
- PVS - Solar photovoltaic energy systems
- Current Stage
- 6060 - National Implementation/Publication (Adopted Project)
- Start Date
- 14-Oct-2019
- Due Date
- 19-Dec-2019
- Completion Date
- 05-Nov-2019
Relations
- Effective Date
- 03-Feb-2026
- Effective Date
- 03-Feb-2026
- Effective Date
- 03-Feb-2026
Overview
SIST EN IEC 63202-1:2019 provides standardized procedures for the measurement of light-induced degradation (LID) in crystalline silicon photovoltaic (PV) cells. Published by the Slovenian Institute for Standardization (SIST) and harmonized with IEC 63202-1:2019, this standard ensures consistency in quantifying the performance losses experienced by PV cells after exposure to simulated sunlight. By establishing reliable LID measurement protocols, the standard helps PV module manufacturers minimize power mismatch between cells, ultimately enhancing the overall energy yield and reliability of solar modules.
Key Topics
- Light-Induced Degradation (LID): Focused on the decline in maximum output power of crystalline silicon solar cells resulting from exposure to light, particularly during initial operation.
- Testing Procedures: Outlines equipment and environmental conditions required for LID testing, including the use of calibrated solar simulators, environmental chambers, and temperature controls.
- Measurement Comparison: Instructs on comparing the output power at Standard Test Conditions (STC) before and after exposure to standardized simulated sunlight at a specified irradiance and temperature.
- Data Reporting: Emphasizes accurate reporting of cell identification, test conditions, initial and post-exposure power values, duration to stabilization, and analysis of statistical uncertainty.
- Quality Assurance: Aims to identify and optimize the performance distribution across cell batches, supporting consistent module assembly and product quality.
Applications
SIST EN IEC 63202-1:2019 is highly relevant for:
- PV Module Manufacturing: Assists manufacturers in selecting and matching cells with minimal performance spread due to LID, thus reducing module mismatch and maximizing array output.
- Quality Control Laboratories: Used as a standardized protocol for third-party testing facilities conducting incoming and outgoing quality checks on crystalline silicon PV cells.
- Research and Development: Facilitates R&D activities aiming to improve PV cell materials and processes to minimize LID effects, advancing overall solar cell performance.
- Certification and Compliance: Supports conformity assessment and product certification procedures, demonstrating compliance with European and international quality expectations for solar photovoltaic devices.
Related Standards
To ensure comprehensive and consistent measurement of photovoltaic device performance, the following standards are referenced by or are relevant in conjunction with SIST EN IEC 63202-1:2019:
- IEC 60904-1: Photovoltaic devices - Part 1: Measurement of photovoltaic current-voltage characteristics. Defines the procedure for measuring the power output of PV cells and modules.
- IEC 60904-2: Photovoltaic devices - Part 2: Requirements for photovoltaic reference devices. Specifies criteria for reference cells used in calibration and testing.
- IEC 60904-9: Photovoltaic devices - Part 9: Solar simulator performance requirements. Describes standards for solar simulators used in laboratory testing.
- IEC 61215 Series: Crystalline silicon terrestrial photovoltaic modules - Design qualification and type approval. Covers broad aspects of PV module performance and durability, including LID at the module level.
Practical Value
By providing a repeatable and transparent approach for measuring and reporting light-induced degradation in crystalline silicon solar cells, SIST EN IEC 63202-1:2019 enables manufacturers and quality assurance professionals to:
- Reduce Cell Mismatch: Select and group cells with similar LID profiles, ensuring uniform module performance.
- Maximize Power Output: Address LID effects early in production, resulting in higher long-term energy yields.
- Enhance Product Reliability: Bolster customer confidence in PV module performance through standardized testing.
- Support Innovation: Encourage ongoing improvements in cell technology by supplying a clear benchmark for LID mitigation.
Consistent application of this standard helps drive efficiency, reliability, and competitiveness in the photovoltaic industry, supporting the global transition to sustainable solar power.
Get Certified
Connect with accredited certification bodies for this standard
DNV
DNV is an independent assurance and risk management provider.
Lloyd's Register
Lloyd's Register is a global professional services organisation specialising in engineering and technology.
DNV Energy Systems
Energy and renewable energy certification.
Sponsored listings
Frequently Asked Questions
SIST EN IEC 63202-1:2019 is a standard published by the Slovenian Institute for Standardization (SIST). Its full title is "Photovoltaic devices - Part 11: Measurement of light-induced degradation of crystalline silicon solar cells". This standard covers: IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance. The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.
IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance. The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.
SIST EN IEC 63202-1:2019 is classified under the following ICS (International Classification for Standards) categories: 27.160 - Solar energy engineering. The ICS classification helps identify the subject area and facilitates finding related standards.
SIST EN IEC 63202-1:2019 has the following relationships with other standards: It is inter standard links to SIST EN IEC 60904-1:2021, SIST EN IEC 60904-2:2024, SIST EN IEC 60904-9:2021. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
SIST EN IEC 63202-1:2019 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
SLOVENSKI STANDARD
01-december-2019
Fotonapetostne naprave - 11. del: Meritve degradacije kristalnih silicijevih sončnih
celic, povzročene s svetlobo
Photovoltaic devices - Part 11: Measurement of light-induced degradation of crystalline
silicon solar cells
Ta slovenski standard je istoveten z: EN IEC 63202-1:2019
ICS:
27.160 Sončna energija Solar energy engineering
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD EN IEC 63202-1
NORME EUROPÉENNE
EUROPÄISCHE NORM
September 2019
ICS 27.160
English Version
Photovoltaic cells - Part 1: Measurement of light-induced
degradation of crystalline silicon photovoltaic cells
(IEC 63202-1:2019)
Cellules photovoltaïques - Partie 1: Mesure de la Photovoltaik-Zellen - Teil 1: Messung der lichtinduzierten
dégradation induite par la lumière des cellules Degradation von kristallinen Silizium-Photovoltaikzellen
photovoltaïques au silicium cristallin (IEC 63202-1:2019)
(IEC 63202-1:2019)
This European Standard was approved by CENELEC on 2019-07-25. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2019 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 63202-1:2019 E
European foreword
The text of document 82/1565/FDIS, future edition 1 of IEC 63202-1, prepared by IEC/TC 82 "Solar
photovoltaic energy systems" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN IEC 63202-1:2019.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2020-04-25
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2022-07-25
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 63202-1:2019 was approved by CENELEC as a European
Standard without any modification.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60904-1 - Photovoltaic devices - Part 1: EN 60904-1 -
Measurement of photovoltaic current-
voltage characteristics
IEC 60904-2 - Photovoltaic devices - Part 2: EN 60904-2 -
Requirements for photovoltaic reference
devices
IEC 60904-9 - Photovoltaic devices - Part 9: Solar EN 60904-9 -
simulator performance requirements
IEC 63202-1 ®
Edition 1.0 2019-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Photovoltaic cells –
Part 1: Measurement of light-induced degradation of crystalline silicon
photovoltaic cells
Cellules photovoltaïques –
Partie 1: Mesure de la dégradation induite par la lumière des cellules
photovoltaïques au silicium cristallin
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 27.160 ISBN 978-2-8322-6896-4
– 2 – IEC 63202-1:2019 © IEC 2019
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Apparatus . 6
5 Sampling . 6
6 Procedure for conditioning and evaluation . 6
7 Report . 8
Annex A (informative) Bar charts presented in the test report, showing the absolute
value of I degradation for all specimens after conditions in 6.1, 6.7 and 6.10 are met . 9
mp
Figure A.1 – I values of all test samples before and after LID tests . 9
mp
IEC 63202-1:2019 © IEC 2019 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PHOTOVOLTAIC CELLS –
Part 1: Measurement of light-induced degradation
of crystalline silicon photovoltaic cells
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative referenc
...