SIST EN ISO 14880-3:2025

SLOVENSKI STANDARD
01-januar-2025
Nadomešča:
SIST EN ISO 14880-3:2006
Optika in fotonska tehnologija - Vrste mikroleč - 3. del: Preskusne metode za
optične lastnosti, razen odstopanja valovne fronte (ISO 14880-3:2024)
Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties
other than wavefront aberrations (ISO 14880-3:2024)
Optik und Photonik - Mikrolinsenarrays - Teil 3: Prüfverfahren für optische Eigenschaften
außer Wellenfrontaberrationen (ISO 14880-3:2024)
Optique et photonique - Réseaux de microlentilles - Partie 3: Méthodes d'essai pour les
propriétés optiques autres que les aberrations du front d'onde (ISO 14880-3:2024)
Ta slovenski standard je istoveten z: EN ISO 14880-3:2024
ICS:
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EN ISO 14880-3
EUROPEAN STANDARD
NORME EUROPÉENNE
November 2024
EUROPÄISCHE NORM
ICS 31.260 Supersedes EN ISO 14880-3:2006
English Version
Optics and photonics - Microlens arrays - Part 3: Test
methods for optical properties other than wavefront
aberrations (ISO 14880-3:2024)
Optique et photonique - Réseaux de microlentilles - Optik und Photonik - Mikrolinsenarrays - Teil 3:
Partie 3: Méthodes d'essai pour les propriétés optiques Prüfverfahren für optische Eigenschaften außer
autres que les aberrations du front d'onde (ISO 14880- Wellenfrontaberrationen (ISO 14880-3:2024)
3:2024)
This European Standard was approved by CEN on 5 August 2023.

CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this
European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references
concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN
member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by
translation under the responsibility of a CEN member into its own language and notified to the CEN-CENELEC Management
Centre has the same status as the official versions.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway,
Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Türkiye and
United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION

EUROPÄISCHES KOMITEE FÜR NORMUNG

CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2024 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO 14880-3:2024 E
worldwide for CEN national Members.

Contents Page
European foreword . 3

European foreword
This document (EN ISO 14880-3:2024) has been prepared by Technical Committee ISO/TC 172 "Optics
and photonics" in collaboration with Technical Committee CEN/TC 123 “Lasers and photonics” the
secretariat of which is held by DIN.
This European Standard shall be given the status of a national standard, either by publication of an
identical text or by endorsement, at the latest by May 2025, and conflicting national standards shall be
withdrawn at the latest by May 2025.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN shall not be held responsible for identifying any or all such patent rights.
This document supersedes EN ISO 14880-3:2006.
Any feedback and questions on this document should be directed to the users’ national standards
body/national committee. A complete listing of these bodies can be found on the CEN website.
According to the CEN-CENELEC Internal Regulations, the national standards organizations of the
following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland,
Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of
North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Türkiye and the
United Kingdom.
Endorsement notice
The text of ISO 14880-3:2024 has been approved by CEN as EN ISO 14880-3:2024 without any
modification.
International
Standard
ISO 14880-3
Second edition
Optics and photonics — Microlens
2024-11
arrays —
Part 3:
Test methods for optical properties
other than wavefront aberrations
Optique et photonique — Réseaux de microlentilles —
Partie 3: Méthodes d'essai pour les propriétés optiques autres que
les aberrations du front d'onde
Reference number
ISO 14880-3:2024(en) © ISO 2024

ISO 14880-3:2024(en)
© ISO 2024
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii
ISO 14880-3:2024(en)
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Substrate test . 1
5 Microscope test method . 1
5.1 Principle .1
5.2 Measurement arrangement and test equipment .2
5.2.1 General .2
5.2.2 Test system .3
6 Procedure . 4
6.1 General .4
6.2 Measurement of effective back or front focal length .4
6.3 Measurement of chromatic aberration .4
6.4 Measurement of the uniformity of the focal spot positions .5
7 Results and uncertainties . 5
8 Coupling efficiency, imaging quality. 6
9 Test report . 6
Annex A (informative) Measurements with wavefront measuring systems . 8
Annex B (informative) Confocal measurement of effective back or front focal length of lens
array .10
Annex C (informative) Coupling efficiency, imaging quality .12
Annex D (informative) Measurement of the uniformity of the focal spot positions of a microlens
array .13
Bibliography . 14

iii
ISO 14880-3:2024(en)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out through
ISO technical committees. Each member body interested in a subject for which a technical committee
has been established has the right to be represented on that committee. International organizations,
governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely
with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of ISO document should be noted. This document was drafted in accordance with the editorial rules of the
ISO/IEC Directives, Part 2 (see www.iso.org/directives).
ISO draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed patent
rights in respect thereof. As of the date of publication of this document, ISO had not received notice of (a)
patent(s) which may be required to implement this document. However, implementers are cautioned that
this may not represent the latest information, which may be obtained from the patent database available at
www.iso.org/patents. ISO shall not be held responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO's adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 172, Optics and Photonics, Subcommittee SC 9,
Laser and electro-optical systems, in collaboration with the European Committee for Standardization (CEN)
Technical Committee CEN/TC 123, Lasers and photonics, in accordance with the Agreement on technical
cooperation between ISO and CEN (Vienna Agreement).
This second edition cancels and replaces the first edition (ISO 14880-3:2006), which has been technically
revised.
The main changes are as follows:
— Introduction revised;
— Reference documents and numbering updated.
A list of all parts in the ISO 14880 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.

iv
ISO 14880-3:2024(en)
Introduction
This document specifies methods of testing optical properties, other than wavefront aberrations, of
microlens arrays. Examples of applications for microlens arrays include three-dimensional displays,
coupling optics associated with arrayed light sources and photo-detectors, enhanced optics for liquid crystal
[12][13][15][16]
displays, and optical parallel processor elements .
The testing of microlenses is in principle similar to testing any other lens. The same parameters need to
be measured and similar techniques used. However, in many cases the measurement of very small lenses
presents practical problems which make it difficult to use the standard equipment that is available for
[15][16]
testing normal size lenses .
The market in microlens arrays has generated a need for agreement on basic terminology and test methods.
Standard terminology and clear definitions are needed not only to promote applications but also to
encourage scientists and engineers to exchange ideas and new concepts based on common understanding.
This document contributes to the purpose of the series of ISO 14880 standards which is to improve the
compatibility and interchangeability of lens arrays from different suppliers and to enhance development of
the technology using microlens arrays.
Characteristic parameters are defined and examples of applications given in ISO 14880-1. It has been
completed by a set of three other International Standards, i.e. ISO 14880-2, ISO 14880-3 and ISO 14880-4.
This document describes the measurement of 1) focal length, 2) coupling efficiency, 3) imaging quality and
4) focal spot positions.
The focal length of the microlens is defined more precisely in 14880-1 as effective back (front) focal length.
The measurement of effective back (front) focal length is described in the body of this part of ISO 14880 and
the use of an alternative technique, interferometry, is described in Annex A.
Measurement of the focal length of an array of microlenses, using a confocal technique, is described in the
main body and Annex B.
Coupling efficiency and imaging quality are discussed in Annex C.
Measurement of the focal spot positions of an array of microlenses in parallel, using the Shack-Hartmann
technique, is described in Annex D.
Wavefront aberrations and characteristics other than optical properties are specified in ISO 14880-2 and
ISO 14880-4 and ISO/TR 14880-5.

v
International Standard ISO 14880-3:2024(en)
Optics and photonics — Microlens arrays —
Part 3:
Test methods for optical properties other than wavefront
aberrations
1 Scope
[1]
This document specifies methods for testing optical properties, other than wavefront aberrations of
microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or
more surfaces of a common substrate and to graded-index microlenses.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content constitutes
requirements of this document. For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments) applies.
ISO 14880-1, Optics and photonics — Microlens arrays — Part 1: Vocabulary
ISO 10110-5, Optics and photonics — Preparation of drawings for optical elements and systems — Part 5:
Surface form tolerances
3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 14880-1 apply.
ISO and IEC maintain terminology databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at https:// www .electropedia .org/
4 Substrate test
The optical quality of the substrate contributes to the quality of the focal positions defined by the microlenses
and shall be quantified in accordance with ISO 10110-5.
5 Microscope test method
5.1 Principle
The basic principle is to locate, by optical means, the surface of the microlens under test. The effective back
(front) focal length is determined by measuring the axial displacement necessary to locate the focal position.

ISO 14880-3:2024(en)
5.2 Measurement arrangement and test equipment
5.2.1 General
The testing of microlenses is similar in principle to testing larger lenses. In many cases however, the
measurement of very small lenses presents practical problems which make it difficult to use standard
equipment. In general, two optical techniques can be used. One is based on microscopy, the other is based on
[2]
interferometry .
The first technique uses a microscope to locate, by focusing, the vertex of the microlens. The effective back
(front) focal length is deduced from a measurement of the displacement necessary to refocus the microscope
on the image of a distant source as shown in Figure 1.
A focusing aid in the microscope such as a split-field focusing graticule enables the featureless vertex of a
microlens to be more readily located when viewing with reflected light. For focal length measurements the
distant point source may be the end face of an illuminated optical fibre or an illuminated test graticule. Tests
may be performed with white light or monochromatic illumination.
The second technique uses wavefront sensing to locate the test surface or the centre of curvature. The
location test may be carried out with the help of one of the following devices:
— Fizeau interferometer,
— Twyman-Green interferometer,
— lateral shearing interferometer, or
— Shack-Hartmann device.
[1][2]
These are more fully described in ISO 14880-2 and ISO/TR 14999-1 . One advantage of interferometry
is that for strongly aberrated lenses, the variation in focal length with aperture radius can be readily
deduced from the interference patterns. A disadvantage is that tests are restricted to the wavelength of the
interferometer light source.
Key
1 distant point source
2 substrate and microlens producing focused spot
3 microscope objective
4 axial adjustment of microscope to locate lens surface and focus
5 beamsplitter
6 source for focus location on lens surface
7 imaging array
Figure 1 — Collimated source and microscope used to measure the effective back or front focal
length of a microlens
Clauses 5 to 9 concentrate on the microscope technique while an interferometric technique is described in
Annex A and a Shack-Hartmann technique in Annex D.

ISO 14880-3:2024(en)
The confocal measurement of the effective focal lengths of lens arrays is described in Annex B.
5.2.2 Test system
5.2.2.1 General
The test system consists of a microscope fitted with displacement transducers, suitable light source, test
object, microscope video camera, monitor and image analyser (line intensity scan).
5.2.2.2 Microscope
A microscope fitted with a focusing aid such as a split-image rangefinder is required to enable focus settings
to be made on a featureless surface such as the vertex of the microlens surface. The mechanical design shall
allow the distant point source or test graticule to be placed below the stage carrying the test lens. Ideally,
the test lens should be supported with no additional optical component such as a glass plate between it and
the distant point source or test graticule. The displacement of the test surface relative to the microscope
objective is measured with a calibrated displacement transducer.
The numerical aperture (N
...