Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -- Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

EN following parallel vote - D114/118: CLC/TC 49 disbanded

Messung von Schwingquarz-Parametern nach dem Null-Phasenverfahren in einem Pi-Netzwerk -- Teil 1: Verfahren zur Messung der Resonanzfrequenz und des Resonanzwiderstandes von Schwingquarzen nach dem Null-Phasenverfahren in einem Pi-Netzwerk

Mesure des paramètres des quartz piézoélectriques par la technique de phase nulle dans le circuit en pi -- Partie 1: Méthode fondamentale pour la mesure de la fréquence de résonance et de la résistance de résonance des quartz piézoélectriques par la technique de phase nulle dans le circuit en pi

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network - Amendment A1 (IEC 60444-1:1986/A1:1999)

General Information

Status
Published
Publication Date
31-Aug-2002
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
01-Sep-2002
Due Date
01-Sep-2002
Completion Date
01-Sep-2002

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Amendment

SIST EN 60444-1:2002/A1:2002

English language (10 pages)
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Relations

Effective Date
19-May-2026
Effective Date
21-Sep-2010

Overview

SIST EN 60444-1:2002/A1:2002 specifies the basic method for measuring key parameters of quartz crystal units using the zero phase technique in a pi-network. This standard, aligned with EN 60444-1:1997/A1:1999 and based on IEC 60444-1:1986/A1:1999, provides clear guidance on the determination of resonance frequency and resonance resistance of quartz crystal units. The amendment introduces updates to formulae and calibration procedures, ensuring greater accuracy for manufacturers and test laboratories working with frequency control and selection devices.

Key Topics

  • Zero Phase Technique in Pi-Network

    • Utilizes a pi-network for precise measurement conditions.
    • Employs the zero phase technique for high-accuracy results.
  • Measurement Parameters

    • Resonance Frequency: The point at which the crystal vibrates at maximum amplitude.
    • Resonance Resistance: The resistance exhibited by the crystal at resonance, essential for quality assessment.
  • Updated Calibration and Error Analysis

    • Introduction of a reference resistor (typically 25 Ω) for calibration instead of a short, improving accuracy.
    • Enhanced procedures for voltage measurement and calculation of errors in resonance resistance.
  • Phase Slope and Quality Factor

    • Methods to derive the phase slope and the corrected formula for the effective quality factor (Qeff) of the quartz crystal unit.

Applications

The methods described in SIST EN 60444-1:2002/A1:2002 are crucial in the following areas:

  • Crystal Manufacturing and Quality Control

    • Enables reliable assessment of quartz crystals used in oscillators, filters, and timing elements.
    • Ensures components meet strict specifications for frequency stability and resistance.
  • Test Laboratories

    • Test setups following this standard ensure consistent and repeatable results, supporting calibration and verification of crystal parameters.
  • Design and Development of Electronic Devices

    • Fundamental for engineers developing circuits that rely on precise frequency control, such as RF modules, communication equipment, and clocks.
  • Metrology and Calibration Services

    • Professional calibration services benefit from the standardized procedures and updated error analysis, enhancing measurement confidence.

Related Standards

When working with quartz crystal unit measurements, consider the following related standards:

  • IEC 61080: Guide to the measurement of equivalent electrical parameters of quartz crystal units.
  • EN 60444-1: European equivalent to the base IEC standard for resonance frequency and resistance measurement.
  • SIST EN 60444 Series: Additional parts focusing on advanced test methods for quartz crystal units.

Additionally, standards covering piezoelectric and dielectric device measurement support comprehensive laboratory and production line practices.


Keywords: quartz crystal unit measurement, zero phase technique, pi-network, resonance frequency, resonance resistance, calibration procedure, stone quality factor, IEC 60444, frequency control, standardization, piezoelectric device measurement.


Adhering to SIST EN 60444-1:2002/A1:2002 ensures reliable, standardized measurement processes for quartz crystal units, supporting the electronics industry's demand for high precision and product consistency.

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Amendment

SIST EN 60444-1:2002/A1:2002

English language (10 pages)
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Frequently Asked Questions

SIST EN 60444-1:2002/A1:2002 is a amendment published by the Slovenian Institute for Standardization (SIST). Its full title is "Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -- Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network". This standard covers: EN following parallel vote - D114/118: CLC/TC 49 disbanded

EN following parallel vote - D114/118: CLC/TC 49 disbanded

SIST EN 60444-1:2002/A1:2002 is classified under the following ICS (International Classification for Standards) categories: 31.140 - Piezoelectric devices. The ICS classification helps identify the subject area and facilitates finding related standards.

SIST EN 60444-1:2002/A1:2002 has the following relationships with other standards: It is inter standard links to oSIST prEN IEC 60444-11:2025, SIST EN 60444-1:2002. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.

SIST EN 60444-1:2002/A1:2002 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.

Standards Content (Sample)


SLOVENSKI STANDARD
01-september-2002
Measurement of quartz crystal unit parameters by zero phase technique in a pi-
network - Part 1: Basic method for the measurement of resonance frequency and
resonance resistance of quartz crystal units by zero phase technique in a pi-
network - Amendment A1 (IEC 60444-1:1986/A1:1999)
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -
- Part 1: Basic method for the measurement of resonance frequency and resonance
resistance of quartz crystal units by zero phase technique in a pi-network
Messung von Schwingquarz-Parametern nach dem Null-Phasenverfahren in einem Pi-
Netzwerk -- Teil 1: Verfahren zur Messung der Resonanzfrequenz und des
Resonanzwiderstandes von Schwingquarzen nach dem Null-Phasenverfahren in einem
Pi-Netzwerk
Mesure des paramètres des quartz piézoélectriques par la technique de phase nulle
dans le circuit en pi -- Partie 1: Méthode fondamentale pour la mesure de la fréquence
de résonance et de la résistance de résonance des quartz piézoélectriques par la
technique de phase nulle dans le circuit en pi
Ta slovenski standard je istoveten z: EN 60444-1:1997/A1:1999
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

NORME CEI
INTERNATIONALE IEC
60444-1
INTERNATIONAL
STANDARD
AMENDEMENT 1
AMENDMENT 1
1999-08
Amendement 1
Mesure des paramètres des quartz
piézoélectriques par la technique de phase nulle
dans le circuit en pi –
Partie 1:
Méthode fondamentale pour la mesure de la
fréquence de résonance et de la résistance de
résonance des quartz piézoélectriques par la
technique de phase nulle dans le circuit en pi
Amendment 1
Measurement of quartz crystal unit parameters
by zero phase technique in a pi-network –
Part 1:
Basic method for the measurement of resonance
frequency and resonance resistance of quartz
crystal units by zero phase technique in
a pi-network
 IEC 1999 Droits de reproduction réservés  Copyright - all rights reserved
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http://www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
H
PRICE CODE
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue

60444-1 Amend. 1 © IEC:1999 – 3 –
FOREWORD
This amendment has been prepared by IEC technical committee 49: Piezoelectric and
dielectric devices for frequency control and selection.
The text of this amendment is based on the following documents:
FDIS Report on voting
49/442/FDIS 49/445/RVD
Full information on the voting for the approval of this amendment can be found in the report on
voting indicated above.
___________
Page 3
CONTENTS
Add the title of annex B as follows:
Annex B – Updating of some formulae of appendix A
Page 43
Add, after appendix A, the new annex B as follows:
Annex B
(normative)
Updating of some formulae of appendix A
B.1 Purposes
In this annex some formulae of the appendix A are updated, taking into account the modified
calibration procedure of the π-network with a reference resistor R = 25 Ω instead of a short.
n
The formula relating R to the measured voltages is derived for arbitrary values of the
r
reference resistor R . The error of R is taken into account in the error analysis for R .
n n r
The formula for current and drive level of the crystal in the π-network is given. The phase slope
of the crystal inserted in the π-network is derived and the formula for Q is corrected.
eff
60444-1 Amend. 1 © IEC:1999 – 5 –
B.2 The -network terminated by Z = 50 (with power splitter according to
π Ω
figure 5a)
Power splitter
(see figure 5a)
Z
c
R R
Z 4
Z
Z
R R R
3 5 6 Z
R V
B
Z
V
V
AA V V
V AAV
B0
IEC  1019/99
Figure B.1 – Terminated π-network
B.3 Voltage transfer factor of the terminated π-network
In the following an elementary derivation of the voltage transfer factor is presented to provide a
more comprehensive formula.
−1
 
1 1

 
= = +
Let R R Z
6 6
 
R Z
 6 

V R
B 6
= = =
Then k 0,3649 (B.1)
π
′ ′
V R + R
B 6 7
−1
 
1 1
′ ′  
 
Define = + = + = = 12,5 Ω
R R  R R  R
5 5 6 7 T2
 ′ 
 
R
R + R
 6 7 
where R is the termination resistance at the output of the π-network as seen by the crystal.
T2
′ ′
R
V
B 5
=
Then (B.2)
′′′ ′
V R + Z
A
5 c
−1
 
′ ′ 1 1
 
 
Define R = R R + Z = +
 
3 3 5 c
 
  ′
R
+
R Z
 5 c 

′′′
V R
A 3
Then = (B.3)
″ ′
V R + R
A 3 4
60444-1 Amend. 1 © IEC:1999 – 7 –
−1
 
1 1
′ ′
   
Define R = R R + R  = +
2 2 3 4
 
  ′
R
2 R + R
 3 4 
Then, for a power splitter according to figure 5a and disregarding the cables:
″ ′
V R
A 2
= (B.4)
′ ′
...