ISO/IEC 16963:2017
(Main)Information technology — Digitally recorded media for information interchange and storage — Test method for the estimation of lifetime of optical disks for long-term data storage
Information technology — Digitally recorded media for information interchange and storage — Test method for the estimation of lifetime of optical disks for long-term data storage
ISO/IEC 16963:2017 specifies an accelerated ageing test method for estimating the lifetime of the retrievability of information stored on recordable or rewritable optical disks. The method is based on the theoretical assumption that the lifetime of data recorded on an optical disk has a lognormal distribution. Detailed testing is specified for the following formats: DVD-R/RW/RAM disks, +R/+RW disks, CD-R/RW disks and BD recordable/rewritable disks. The testing can be applied to additional optical-disk formats with substitution of the appropriate specifications and can also be updated by the committee in the future as required. ISO/IEC 16963:2017 includes: - stress conditions: - Basic and Rigorous stress-conditions for testing and subsequent analysis using both the Eyring and Arrhenius methods; - ambient storage conditions in which the lifetime of data stored on optical disk is estimated: - a Controlled storage-condition, Temp = 25 °C and RH = 50 %, representing full-time air conditioning. The Eyring method is used to estimate the lifetime under this storage condition; - a Harsh storage-condition, Temp = 30 °C and RH = 80 %, representing the most severe conditions in which users handle and store optical disks. The Arrhenius method is used to estimate the lifetime under this storage condition; - a description of the evaluation system; - procedures for specimen preparation and data acquisition; - definitions and methods used in testing specific disk types; - analysis of test results to determine the lifetime of stored data; - a format for reporting the estimated lifetime of stored data. The methodology includes only the effects of temperature and relative humidity. It does not attempt to model degradation due to complex failure mechanism kinetics, nor does it test for exposure to light, corrosive gases, contaminants, handling, or variations in playback subsystems. Disks exposed to these additional sources of stress or higher levels of temperature and relative humidity are expected to experience shorter usable lifetime.
Technologies de l'information — Supports pour l'échange d'informations et le stockage enregistrés numériquement — Méthode d'essai pour l'estimation de la durée de vie de disques optiques pour le stockage à long terme
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Standards Content (Sample)
INTERNATIONAL ISO/IEC
STANDARD 16963
Third edition
2017-07
Corrected version
2019-04
Information technology — Digitally
recorded media for information
interchange and storage — Test
method for the estimation of lifetime of
optical disks for long-term data storage
Technologies de l'information — Supports pour l'échange
d'informations et le stockage enregistrés numériquement — Méthode
d'essai pour l'estimation de la durée de vie de disques optiques pour le
stockage à long terme
Reference number
©
ISO/IEC 2017
© ISO/IEC 2017
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ii © ISO/IEC 2017 – All rights reserved
Contents Page
Foreword .v
Introduction .vi
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 2
4 Abbreviated terms . 4
5 Conformance . 4
6 Convention and notations . 5
6.1 Representation numbers . 5
6.2 Variables . 5
6.3 Names . 5
7 Measurements . 5
7.1 Summary . 5
7.1.1 Stress incubation and measuring . 5
7.1.2 Assumptions . 5
7.1.3 Data error . 6
7.1.4 Data quality . 7
7.1.5 Regression . 7
7.2 Test specimen . 7
7.3 Recording conditions . 8
7.3.1 General. 8
7.3.2 Recording test environment . 8
7.4 Playback conditions . 8
7.4.1 Playback tester . 8
7.4.2 Playback test environment . 8
7.4.3 Calibration . 9
7.5 Disk testing locations . 9
7.5.1 General. 9
7.5.2 Rigorous testing location . 9
7.5.3 Basic testing location . 9
8 Accelerated stress test . 9
8.1 General . 9
8.2 Stress conditions .10
8.2.1 General.10
8.2.2 Temperature .11
8.2.3 Relative humidity .11
8.2.4 Incubation and ramp profiles .11
8.3 Measuring-time intervals .12
8.4 Design of stress conditions .13
8.5 Disk orientation .13
9 Lifetime estimation.13
9.1 Time-to-failure .13
9.2 Accelerated-ageing test method.14
9.2.1 Eyring acceleration model (Eyring method) .14
9.2.2 Arrhenius acceleration model (Arrhenius method) .14
9.3 Data analysis and judgment of effectiveness .15
9.4 Result of estimated disk life .15
Annex A (normative) Outline of Disk-life estimation method and data-analysis steps .16
Annex B (normative) Disk-life estimation for Controlled storage-condition (Eyring method) .23
© ISO/IEC 2017 – All rights reserved iii
Annex C (normative) Disk-life estimation for Harsh storage-condition (Arrhenius method) .38
Annex D (normative) Alternative non-destructive stress-condition .43
Annex E (informative) Interval estimation for B Life using maximum likelihood .45
Annex F (informative) RSER measurement of BD disks.51
Bibliography .52
iv © ISO/IEC 2017 – All rights reserved
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are
members of ISO or IEC participate in the development of International Standards through technical
committees established by the respective organization to deal with particular fields of technical
activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international
organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the
work. In the field of information technology, ISO and IEC have established a joint technical committee,
ISO/IEC JTC 1.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for
the different types of document should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject
of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent
rights. Details of any patent rights identified during the development of the document will be in the
Introduction and/or on the ISO list of patent declarations received (see www .iso .org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation on the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to the
World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see the following
URL: www .iso .org/iso/foreword .html.
This document was prepared by Technical Committee ISO/IEC JTC 1, Information technology, SC 23,
Digitally recorded media for information interchange and storage.
This third edition cancels and replaces the second edition (ISO/IEC 16963:2015), which has been
technically revised.
The main changes compared to the previous edition are as follows:
— minor enhancement has been made so that the stress condition and the disk testing location are
independent of each other and the cross-combinations of them are applicable; and
— minor editorial changes have been made to conform to the latest version of the ISO/IEC Directives
Part 2.
This corrected version of ISO/IEC 16963:2017 incorporates the following corrections:
— correction of the formula in E.3 that uses function ln L = ln L(β,σ) to express the Fisher information
matrix I in E.2.
© ISO/IEC 2017 – All rights reserved v
Introduction
Markets and industry have developed a common understanding that the property referred to as the
lifetime of data recorded to optical disks plays an increasingly important role in many applicati
...
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