Abstract

IEC 62047-56:2026 specifies the requirements and test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor.

Status
Published
Publication Date
27-Oct-2026
Current Stage
PPUB - Publication issued
Start Date
28-Oct-2026
Completion Date
20-Nov-2026

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IEC 62047-56:2026 - Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

ISBN:978-2-8327-1568-0
Release Date:28-Oct-2026
English language (13 pages)
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IEC 62047-56:2026 is an International Standard published by the International Electrotechnical Commission (IEC). It specifies the requirements and test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensors. In practice, it gives a common way to measure and report gas response, response time, recovery time, sensitivity and selectivity for these sensors.

What does IEC 62047-56:2026 specify?

IEC 62047-56:2026 covers how to evaluate MEMS MOS type gas sensor characteristics and how to report the results. The standard is organized into scope, normative references, terms and definitions, working principle, test method, data analysis, and an informative annex with examples.

AnnexWhat it covers
Annex AExample photograph of a fabricated MEMS MOS type gas sensor and example measured data

The scope is limited to characteristics testing of MEMS MOS type gas sensors. The document also places the test method in the context of sensor working principles, so the measurement method matches the way these devices respond to target gases.

What are the key requirements of IEC 62047-56:2026?

IEC 62047-56:2026 sets out the main measurement steps, the calculation methods, and the information that must appear in the test report. The practical focus is on getting comparable gas-response data from a sensor under defined conditions.

Gas response is defined from resistance values

Clause 5.1 defines gas response from the ratio between the resistance in air and the saturated resistance in the target gas. IEC 62047-56:2026 uses one formula for N-type MOS and another for P-type MOS, and the calculated gas response is required to be greater than 1. In practice, the user must identify the sensor type correctly before calculating and reporting the result.

The apparatus must support controlled gas exposure

Clause 5.2 specifies a measurement setup made up of a gas sensor chamber, balance gas such as air or nitrogen, target gas, a mass-flow controller, a power supplier and a data acquisition system. This matters because the sensor response depends on stable gas delivery, electrical drive and signal capture.

The test procedure is defined step by step

Clause 5.3 describes preparation and measurement steps, including cleaning the MEMS substrate before metal oxide deposition, checking the fabricated sensor for visible damage, mounting it in a suitable holder, connecting the microheater and microelectrode, measuring microheater surface temperature with an IR camera, and calibrating gas concentration and temperature control. In practice, the user has to control contamination, temperature and gas concentration before recording results.

Response, recovery, sensitivity and selectivity are analyzed separately

Clause 6.1 defines sensitivity from the change in gas response divided by the change in gas concentration. It also defines selectivity as the sensitivity toward the target gas compared with the sensitivity toward an interfering gas. This gives laboratories a way to show not only that the sensor reacts, but also how strongly and how selectively it reacts.

The test report has a defined content

Clause 6.2 requires the report to identify the specimen, test conditions, balance gas, target gas, calculated gas response, response time, recovery time, sensitivity, selectivity, test date, testing organization and a reference to IEC 62047-56. Table 1 lists the parameters to include, so users can document the same information in a consistent format.

The sensor behavior is explained in the standard

Clause 4 describes the working principle for MOS type gas sensors, including N-type MOS and P-type MOS behavior. That context helps users interpret why resistance changes with gas exposure and why operating temperature is part of the test.

What terms does IEC 62047-56:2026 define?

IEC 62047-56:2026 defines the key terms used to describe sensor performance and gas exposure.

  • Gas sensor response time - the time from first reaction to the saturated value at a specified percentage level, generally 90%.
  • Gas sensor recovery time - the time needed for the sensor to return to, generally, 90% of the base resistance after the target gas is removed.
  • Gas sensing materials - materials used for sensitive and selective gas detection or for measuring gas concentration.
  • N-type MOS - an MOS sensing material such as SnO2, ZnO, In2O3 or WO3 that follows the response behavior described for N-type devices.
  • P-type MOS - an MOS sensing material such as Co3O4, NiO or CuO that follows the opposite response behavior to N-type MOS.
  • MEMS - micro-electromechanical systems, the device platform used for the gas sensor structure in this standard.
  • MOS - metal oxide semiconductor, the sensing material class used for gas detection.

Who uses IEC 62047-56:2026?

IEC 62047-56:2026 is used by sensor manufacturers, test laboratories, research engineers and quality teams that characterize MEMS MOS type gas sensors. It is relevant in environmental monitoring, industrial safety, automotive exhaust control and indoor air quality work where gas detection performance must be measured and reported in a defined way.

Which standards are used with IEC 62047-56:2026?

IEC 62047-56:2026 refers to IEC 62047-1 for common terms and definitions used across the IEC 62047 series. It also refers to IEC 60079-29-1, which provides performance requirements for detectors for flammable gases and supports gas-detector evaluation where that context applies.

What does the IEC 62047-56:2026 document contain?

IEC 62047-56:2026 contains a worked technical structure rather than a general overview. It includes figures showing the sensor structure, the gas-response behavior, the sensing mechanism for N-type and P-type MOS, the sensitivity concept, and the test apparatus.

It also provides formulas for gas response, sensitivity and selectivity, plus a stepwise test procedure for preparing the sensor, controlling the chamber and recording electrical response. Table 1 defines the report contents, and Annex A gives an example photograph and example measured data for a fabricated sensor.

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Standard

IEC 62047-56:2026 - Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

ISBN:978-2-8327-1568-0
Release Date:28-Oct-2026
English language (13 pages)
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Preview
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Frequently Asked Questions

IEC 62047-56:2026 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor". This standard covers: IEC 62047-56:2026 specifies the requirements and test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor.

IEC 62047-56:2026 specifies the requirements and test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor.

IEC 62047-56:2026 is classified under the following ICS (International Classification for Standards) categories: 31.080.99 - Other semiconductor devices. The ICS classification helps identify the subject area and facilitates finding related standards.

IEC 62047-56:2026 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.

Standards Content (Sample)


IEC 62047-56 ®
Edition 1.0 2026-10
INTERNATIONAL
STANDARD
Semiconductor devices - Micro-electromechanical devices -
Part 56: Test method for characteristics of MEMS metal oxide semiconductor
(MOS) type gas sensor
ICS 31.080.99 ISBN 978-2-8327-1568-0

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CONTENTS
FOREWORD . 2
INTRODUCTION . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Working principle of MOS type gas sensor. 7
4.1 General . 7
4.2 N-type MOS . 7
4.3 P-type MOS . 7
5 Test method . 8
5.1 General . 8
5.2 Configuration of the apparatus for characteristics measurement of MEMS
MOS type gas sensor . 9
5.3 Test procedure. 9
6 Data analysis . 10
6.1 Calculating results . 10
6.2 Test report . 11
Annex A (informative) . 12
A.1 Photograph of fabricated MEMS MOS type gas sensor as an example . 12
A.2 Measured data using MEMS MOS type gas sensor as an example. 12
Bibliography . 13

Figure 1 – Schematic illustration of MEMS MOS type gas sensor . 5
Figure 2 – An exemplary graph showing gas response of a MEMS MOS type gas
sensor . 7
Figure 3 – Schematic drawing of gas sensing mechanism: (a) N-type and (b) P-type
MOS gas sensors . 8
Figure 4 – Exemplary graph to define sensitivity of a MEMS MOS type gas sensor . 9
Figure 5 – Schematic drawing of the apparatus for characteristics measurement of
MEMS MOS type gas sensor . 9
Figure A.1 – Photograph of fabricated MEMS MOS type gas sensor as an example . 12

Table 1 – Table for test report of characteristics of MEMS MOS type gas sensor . 11
Table A.1 – Table for measured data using MEMS MOS type gas sensor as an
example . 12

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Semiconductor devices - Micro-electromechanical devices -
Part 56: Test method for characteristics of MEMS metal oxide
semiconductor (MOS) type gas sensor

FOREWORD
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IEC 62047-56 has been prepared by subcommittee 47F: Micro-electromechanical devices, of
IEC technical committee 47: Semiconductor devices. It is an International Standard.
The text of this International Standard is based on the following documents:
Draft Report on voting
47F/568/FDIS 47F/575/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
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devices - Micro-electromechanical devices can be found on the IEC website.
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– revised.
INTRODUCTION
Micro-electromechanical systems (MEMS) metal oxide semiconductor (MOS) type gas sensor
is one of key components in MEMS technologies including chemical MEMS and bio-MEMS.
MEMS MOS type gas sensor, in general, consists of MEMS structure with membrane for thermal
isolation, microheater for controlling operation temperature, insulator layer between
microheater and microelectrode, and microelectrode for measuring resistance change of gas
sensing materials on microelectrode. It is possible to detect specific gas or measure the gas
concentration by using highly sensitive and selective gas sensing materials.
Micro-electromechanical systems (MEMS) metal oxide semiconductor (MOS) gas sensors
represent a significant advancement in the field of gas detection technology. These sensors
leverage the integration of MEMS technology with the gas-sensitive properties of metal oxide
semiconductors to offer a compact, efficient, and highly sensitive solution for detecting a wide
range of gases. MEMS technology enables the miniaturization of gas sensors, enabling them
to be manufactured on a microscopic scale with high precision and at a lower cost. The use of
metal oxide semiconductors, such as tin oxide (SnO ), zinc oxide (ZnO), or titanium dioxide
(TiO ), provides the sensor with the ability to detect various gases through changes in electrical
resistance when exposed to target gases like hydrogen disulfide (H S), carbon monoxide (CO),
nitrogen dioxide (NO ), or volatile organic compounds (VOCs). The combination of MEMS and
MOS technologies results in sensors that are not only small and portable but also exhibit fast
response times, low power consumption, and high sensitivity. These attributes make MEMS
MOS gas sensors ideal for applications in environmental monitoring, industrial safety,
automotive exhaust control, and indoor air quality management. As the demand for more
efficient an
...