IEC 61643-21:2000+AMD1:2008 CSV

IEC 61643-21
Edition 1.1 2009-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Low voltage surge protective devices –
Part 21: Surge protective devices connected to telecommunications and
signalling networks – Performance requirements and testing methods

Parafoudres basse tension –
Partie 21: Parafoudres connectés aux réseaux de signaux et de
télécommunications – Prescriptions de fonctionnement et méthodes d’essais
IEC 61643-21:2000+A1:2008
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IEC 61643-21
Edition 1.1 2009-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Low voltage surge protective devices –
Part 21: Surge protective devices connected to telecommunications and
signalling networks – Performance requirements and testing methods

Parafoudres basse tension –
Partie 21: Parafoudres connectés aux réseaux de signaux et de
télécommunications – Prescriptions de fonctionnement et méthodes d’essais

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CS
CODE PRIX
ICS 29.240; 29.240.10 ISBN 2-8318-9836-6

– 2 – 61643-21 © IEC:2000+A1:2008
CONTENTS
FOREWORD.5
INTRODUCTION.7
1 General .8
1.1 Scope.8
1.2 SPD configurations.8
1.3 Use of this standard .10
2 Normative references .13
3 Definitions .14
4 Service and test conditions.17
4.1 Service conditions .17
4.1.1 Normal service conditions.17
4.1.2 Abnormal service conditions .18
4.2 Test temperature and humidity .18
4.3 SPD testing .18
4.4 Waveform tolerances.19
5 Requirements .19
5.1 General requirements.19
5.1.1 Identification and documentation .19
5.1.2 Marking .19
5.2 Electrical requirements.20
5.2.1 Voltage-limiting requirements .20
5.2.2 Current-limiting requirements .21
5.2.3 Transmission requirements.22
5.3 Mechanical requirements.22
5.3.1 Terminals and connectors.23
5.3.2 Mechanical strength (mounting).24
5.3.3 Resistance to ingress of solid objects and to harmful ingress of water .24
5.3.4 Protection against direct contact.24
5.3.5 Fire resistance.24
5.4 Environmental requirements .24
5.4.1 High temperature and humidity endurance.24
5.4.2 Environmental cycling with impulse surges .25
5.4.3 Environmental cycling with a.c. surges .25
6 Type test .25
6.1 General tests.25
6.1.1 Identification and documentation .25
6.1.2 Marking .25
6.2 Electrical tests.26
6.2.1 Voltage-limiting tests .26
6.2.2 Current-limiting tests .32
6.2.3 Transmission tests .35
6.3 Mechanical tests .37
6.3.1 Terminals and connectors.37
6.3.2 Mechanical strength (mounting).39
6.3.3 Resistance to ingress of solid objects and to harmful ingress of water .39
6.3.4 Protection against direct contact.39

61643-21 © IEC:2000+A1:2008 – 3 –
6.3.5 Fire resistance.40
6.4 Environmental tests.41
6.4.1 High temperature and humidity endurance.41
6.4.2 Environmental cycling with impulse surges .41
6.4.3 Environmental cycling with a.c. surges .42
6.5 Acceptance tests.42

Annex A (informative) Devices with current-limiting components only .56
Annex B (Void) .57
Annex C (Void) .58
Annex D (informative) Measurement accuracy .59
Annex E (informative) Determination of let-through current (I ).60
p
Bibliography.63

Figure 1 – SPD configurations .9
Figure 16 – Examples of multi-line SPDs with a common protective element.28
Figure 2 – Test circuits for impulse reset time.43
Figure 3 – Test circuits for a.c. durability and overstressed fault mode .44
Figure 4 – Test circuits for impulse durability and overstressed fault mode .45
Figure 5 – Test circuits for rated current, series resistance, response time,
current reset time, maximum interrupting voltage and operating duty test .46
Figure 6 – Test circuits for a.c. durability .47
Figure 7 – Test circuits for impulse durability .48
Figure 8 – Test circuits for insertion loss.49
Figure 9 – Test circuit for return loss .49
Figure 10 – Test circuits for longitudinal balance .50
Figure 11 – Test circuit for bit error ratio test .51
Figure 12 – Test circuit for near-end crosstalk .52
Figure 13 – Test circuits for high temperature/humidity endurance
and environmental cycling.53
Figure 14 – Environmental cycling schedule A with RH ≥ 90 % .54
Figure 15 – Environmental cycling B .55
Figure A.1 – Configurations of devices with current-limiting component(s) only.56
Figure E.1 – Determination of differential mode let-through current.60
Figure E.2 – Determination of common mode let-through current .61
Figure E.3 – Determination of differential mode let
...